$B!!!!!!H/I=O@J8%j%9%H(B-$B#9(B $B868&;\@_MxMQ6&F18&5f(B |
$B$3$N%j%9%H$K$O!"#2#0#0#2G/#47n$+$i#2#0#0#3G/#67n$K$+$1$F(B |
$B8&5f@.2LO"MmI<$K$h$C$F86;RNO8&5fAm9g%;%s%?!<$KEPO?$N$"$C(B |
$B$?$b$N$r<}O?$7$FM-$j$^$9!#(B |
$BO@J8L>(B | $BCx |
$B7G:\;oL>(B $B4,9f(I%$B%Z!<%8(I%$BH/9TG/(B |
$BMxMQ;\@_(B | $B%-!<%o!<%I(B |
Nuclear spin relaxation of extremely dilute impurities using Brute-force NMRON | K.Nishimura($BIY;3Bg(B) S.Ohya,Y.Kawamura,T.Ohtsubo, T.Izumikawa ($B?73cBg(B) S.Muto (KEK) K.Mori($BIY;3Bg(B) |
J. PhyS.Soc. Jpn.71 (2002)1589-1593 |
JRR-3,HR-1 | Brute-force NMRON, l ow temperature, relaxation time, dilute impurities |
155Gd Mossbauer spectroscopic study of GdM(CN)6.4H2O (M=Cr$B-7(B,Fe$B-7(B & Co$B-7(B) & KGdM(CN)6.3H2O (M=Fe$B-6(B & Ru$B-6(B) | J.Wang,J.Abe,T.Kitazawa, M.Takahashi,M.Takeda($BElK.BgM}(B) |
Z.NaturforscH.57a (2002) 581-585 |
JRR-3M HR-2 | (IR=J^310$BJ,8w(B, $BD6J,;R:xBN(B, (I<1I$B:xBN(B |
155Gd Mossbauer spectra of some Gd(III)-$B&B(B-diketonato complexes | J.Wang,M.Takahashi, T.Kitazawa,M.Takeda($BElK.BgM}(B) |
J. Raioanal. Nucl. CheM.255 (2003) 195-199 |
JRR-3M HR-2 | (IR=J^310$BJ,8w(B, $B&B(B-(I<^9D]$B:xBN(B |
161Dy Mossbauer spectra for cyano coordination polymer compounds | K.Suzuki,T.Kitazawa, M.Takahashi,M.Takeda($BElK.BgM}(B) |
J. Raioanal. Nucl. CheM.255 (2003) 305-309 |
JRR-3M HR-2 | (IR=J^310$BJ,8w(B, (I<1I$B:xBN(B, $B3J;RNO3X(B, $B>o<'@-4KOB(B |
The relation between Sb-I bond lengths and charges on iodine atoms determined by 127I Mossbauer spectroscopy | M.Takeda,M.Takahashi, K-Y.Akiba,S.Kojima ($BElK.BgM}(B,$B9-EgBgM}(B,$BAaBg(B) |
J. Raioanal. Nucl. CheM.255 (2003) 275-278 |
JRR-3M BR-1 | (IR=J^310$BJ,8w(B, $B7k9g5wN%(B, $BEE;R>uBV(B |
127I Mossbauer spectra for phenyl iodonium ylides | T.Nishimura,H.Iwasaki, M.Takahashi,M.Takeda($BElK.BgM}(B) |
J. Raioanal. Nucl. CheM.255 (2003) 499-502 |
JRR-3M BR-1 | (IR=J^310$BJ,8w(B, (IV0D^F3Q2XD^(B, $BEE;R>uBV(B |
237Np Mossbauer spectra for Neptunyl($B-:(B) oxalate NpO2C2O4(I%(B3H2O and amorphours Neptenyl($B-:(B)hydroxide NpO2(OH)2(I%(BxH2O, | J.Wang,T.kitazawa, M.Nakada,T.Yamashita,M.Takeda |
J. Nucl. Sci.Tecnol. Supplement 3,429-432 (2002). |
$B!!(B | $B!!(B |
$B4uEZN`2=9gJ*$N%a%9%P%&%"! | $B9b66!!@5(B,$B2&!!738W(B,$BKL_79';K(B, $BC]EDK~='M:(B($BElK.BgM}(B) |
$BJ| |
JRR-3M HR-2 JRR-3M PN-1 |
(IR=J^310$BJ,8w(B, $B4uEZN`2=9gJ*(B, $B@~8;:n@.(B |
$BO@J8L>(B | $BCx |
$B7G:\;oL>(B $B4,9f(I%$B%Z!<%8(I%$BH/9TG/(B |
$BMxMQ;\@_(B | $B%-!<%o!<%I(B |
Optical absorption peaks observed in electron-irradiated n-type Si | Masahi Suezawa,Naoki Fukata and Atsuo Kasuya ($BElKLBg3X6bB0:`NA8&5f=j(B) |
Physica B 308-310 (2001) 276-279 |
$B9b:j8&(B, 2$B9f2CB.4o(B |
(I $B8w5[<}(B |
Complexes of point defects and impurities in electron-irradiated CZ-Si doped with hydrogen | Akiko Nakanishi,Naoki Fukata and Masashi Suezawa ($BElKLBg3X6bB0:`NA8&5f=j(B) | Physica B 308-310 (2001) 216-219 | $B9b:j8&(B, 2$B9f2CB.4o(B |
(I $B8w5[<}(B |
Temperature dependences of linewidths and peaK.positions of optical absorption peaks due to localized vibration of hydrogen in Si | Masashi Suezawa,Naoki Fukata, Mineo Saito and Hiroshi Yamada-Kaneta ($BElKLBg3X6bB0:`NA8&5f=j(B) |
Physica B 308-310 (2001) 220-223 |
$B9b:j8&(B, 2$B9f2CB.4o(B |
(I $B8w5[<}(B |
Temperature dependence of vibrational spectra of H-point defect complexes and H2* in Si | Masashi Suezawa,Naoki Fukata, Toru Takahashi,Mineo Saito, Hiroshi Y.-Kaneta ($BElKLBg3X6bB0:`NA8&5f=j(B) |
PhyS.Rev. B 64 (2001) 085205-1$B!A(B7 |
$B9b:j8&(B, 2$B9f2CB.4o(B |
(I $B8w5[<}(B |
Formation of defect complexes by electron-irradiation of hydrogenated crystalline silicon | Masashi Suezawa ($BElKLBg3X6bB0:`NA8&5f=j(B) |
PhyS.Rev. B 63 (2000) 035201-1$B!A(B7 |
$B9b:j8&(B, 2$B9f2CB.4o(B |
(I $B8w5[<}(B |
Hydrogen-related complexes formed by electron-irradiation of hydrogenated silicon | Masashi Suezawa ($BElKLBg3X6bB0:`NA8&5f=j(B) |
PhyS.Rev. B 63 (2001) 035203-1$B!A(B8 |
$B9b:j8&(B, 2$B9f2CB.4o(B |
(I $B8w5[<}(B |
$BN)BN5,B'@-%"%$%=%?%/%A%C%/%]%j%"%/%j%m%K%H%j%k$N#3 |
$B3'@n(B,$B66K\(B,$BGr0f(B,$B?9ED(B($B;37ABg(B) $B5H0f(B($B868&9b:j(B) |
Colloid Polymer Science,2000,278, 352-357 ((ID^2B:[2D^$B3X2q(B) |
$B6(NO8&5f(B | $BN)BN5,B'@-(B, (I12?@8A/8(B, (IN_X18X[FDXY(B, (I<^FDXY$BMOG^(B, $B9b29MO2r8=>](B |
$BN)BN5,B'@-%"%$%=%?%/%A%C%/%]%j%"%/%j%m%K%H%j%k$N#3 |
$B3'@n(B,$B2,ED(B,$BLnFb(B($B;37ABg(B) $B5H0f(B($B868&9b:j(B) |
Colloid Polymer Science,2000, 278,757-763 ((ID^2B:[2D^$B3X2q(B) |
$B6(NO8&5f(B | $BEE;R@~>H (IN_X18X[FDXY(B, $B9=B$$HJ*@-$NAj4X(B |
$BEE;R@~>H |
$B3'@n(B,$B2,ED(B,$BLnFb(B($B;37ABg(B) $B5H0f(B($B868&9b:j(B) |
Colloid Polymer Science,2000,278, 757-763 ((ID^2B:[2D^$B3X2q(B) |
$B6(NO8&5f(B | $BEE;R@~>H (IN_X18X[FDXY(B, $B9=B$$HJ*@-$NAj4X(B |
$BG"AGJq@\=E9g$K$h$C$FN)BN5,B'@-%]%j%"%/%j%m%K%H%j%k(B(83-25$B!s(B)$BJ4KvBN$N9-3Q#X@~B,Dj!'FC0[$JN)BN5,B'EY!]7k>=2=EY$N4X78(B | $B3'@n(B,$BJ?(B,$BLyEDLy(B,$BLn:j(B($B;37ABg(B) $B5H0f(B($B868&9b:j(B) |
Macromolecules, 2001,34$B4,(B,11$B9f(B ((I1RX6$B2=3X2q(B) 3679-3683 |
$B6(NO8&5f(B | $BN)BN5,B'@-(B (IN_X18X[FDXY(B, $B#X@~9-3QB,Dj(B, $B0[>o$J(I@8C(<0(B $B7k>=2=EYAj4X(B |
Radiation induced lattice defects in InGaAsP laser diodes and their effects on devices performance | $BBg;31QE5(B,$BGnB?E/:H(B,$B9)F#M'M5(B, $BJF2,>-;J(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B9b8+J]@6(B($BN)65Bg(B) $B?\1JGnH~(B($B9b:j868&(B) |
PhysicaB,273-274, p.1031-1033(1999) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
InGaAsP(IC^J^2=(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Impact of induced lattice defects on performance degrdation of AlGaAs/GaAs p-HEMTs | $BBg;31QE5(B,$BGnB?E/:H(B, $B9)F#M'M5(B($B7'K\EEGH9b@l(B) $B9uED<"(B($BIY;NDL(I6]@QC^J^2=(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B9b8+J]@6(B($BN)65Bg(B) $B?\1JGnH~(B($B9b:j868&(B) |
Physica B ,273-274, p.1034-1036(1999) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
HEMT(IC^J^2=(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation induced lattice defects in InGaP/GaAs p-HEMTs and their effects on device performance | $BBg;31QE5(B,$BGnB?E/:H(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B9uED<"(B($BIY;NDL(I6]@QC^J^2=(B) $B9b8+J]@6(B($BN)65Bg(B) $B?\1JGnH~(B($B9b:j868&(B) |
Solid StatePhenomena, 69-70,p.563-568(1999) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
HEMT(IC^J^2=(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Impact of the divacancy on the generation - recombination properties of high-energy particles irradiated Flot-Zone silicon diodes | $BBg;31QE5(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) |
Nucl.Instrum. Methods A,439, p.310-318(2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
Si(IC^J^2=(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Impact of neutron irradiation on optical perfomance of InGaAsP later diodes | $BBg;31QE5(B,$B9)F#M'M5(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B9b8+J]@6(B($BN)65Bg(B) $B?\1JGnH~(B($B9b:j868&(B) |
Solid Thin Films, 364,p.250-254(2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
InGaAsP(IC^J^2=(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation damage of n-MOSFETs fabricated in a fabricated in a BiCMOS process | $BBg;31QE5(B,$BJF2,>-;N(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B9b8+J]@6(B($BN)65Bg(B) $BCfNS@5OB(B($B;0I)EE5!(B) $B?\1JGnH~(B($B9b:j868&(B) |
Journal of Materials Science, 12,p.227-230 (2001) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
MOS(IC^J^2=(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Impact of lattice defects on device performance of AlGaAs /GaAs p-HEMTs | $BBg;31QE5(B,$BGnB?E/:H(B,$B9)F#M'M5(B, $B;g3@0lDg(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B9b8+J]@6(B($BN)65Bg(B) $B?\1JGnH~(B($B9b:j868&(B) |
Solid State Phenomena,78-79, p.319-324(2001) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
HEMT(IC^J^2=(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Negative photo inductivity in polycrystalline silicon films doped with phosphorus | $BBg;31QE5(B,$BJF2,>-;N(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $BCfNS@5OB(B($B;0I)EE5!(B) $B9b8+J]@6(B($BN)65Bg(B) $B?\1JGnH~(B,$BBm_7=U4n(B($B9b:j868&(B) |
Solid State Phenomena,78-79, p.225-230(2001) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
(IN_X $BF3F~3J;R7g4Y(B |
Radiation induced defects in n-MOSFETs and their effects on device perfprmance | $BBg;31QE5(B,$B9)F#M'M5(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B9b8+J]@6(B($BN)65Bg(B) $B8E1H=EH~(B($B6e9)Bg(B) |
Solid State Phenomena,78-79, p.205-210(2001) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
MOS(IC^J^2=(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Effect of lattice defects on degradation of flash memory cell | $BBg;31QE5(B,$B9)F#M'M5(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B9b8+J]@6(B($BN)65Bg(B) $B8E1H=EH~(B($B6e9)Bg(B) |
Solid State Phenomena,78-79, p.231-236(2001) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
(ILW/<-RSX0(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Assessment of radiation induced lattice defects in shallow trench isolation diodes irradiated by neutron | $BBg;31QE5(B,$BMU;3@651(B($B7'K\EEGH9b@l(B) $BCfNS@5OB(B($B;0I)EE5!(B) $B8E1H=EH~(B($B6e9)Bg(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B>.NS0lGn(B(NIMS) |
Solid State Phenomena,78-79, p.357-366(2001) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
STI(I@^250D^(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation damages of polycrystalline silicon films and npn Si transistors by high-energy particle irradiation | $BBg;31QE5(B($B7'K\EEGH9b@l(B) $BCfNS@5OB(B($B;0I)EE5!(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $BJ?HxIRM:(B($B9b:j868&(B) |
Microelectron. Reliab.,41, p.1443-1448(2001) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
Si(IDW]<^=@(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation damage of InGaAsP later diodes by high-temperature $B&C(B-ray and electron irradition | $BBg;31QE5(B($B7'K\EEGH9b@l(B) $BCfNS@5OB(B($B;0I)EE5!(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $BJ?HxIRM:(B($B9b:j868&(B) |
Proc. of the 31th European Solid-State device Research Conference ESSDERC 2001, p.351-355 (2001) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
InGaAs(IC^J^2=(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Reliability of polycrystalline silicon film resistors | $BBg;31QE5(B($B7'K\EEGH9b@l(B) $BCfNS@5OB(B($B;0I)EE5!(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) |
Microelectron.Reliab., 41,p.1341-1346(2001). |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
(IN_X $BF3F~3J;R7g4Y(B |
Induced lattice defects in InGaAsP later diodes by high-temperature gamma ray irradiation | $BBg;31QE5(B($B7'K\EEGH9b@l(B) $BCfNS@5OB(B($B;0I)EE5!(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $BJ?HxIRM:(B($B9b:j868&(B) |
Physica B,308-310, p.1185-1188(2001) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
InGaAs(IC^J^2=(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation defects in STI Silicon diodes and their effects on device performance | $BBg;31QE5(B,$BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B9b8+J]@6(B($BN)65Bg(B) $B>.NS0lGn(B(NIMS) $BJ?HxIRM:(B,$B0KF#5W5A(B($B9b:j868&(B) |
Physica B,308-310, p.1217-1221(2001) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
STI(IC^J^2=(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Impact of lattice defects on the performance degradation of Si photodiodes by high-temperature gamma and electoron irradiation | $BBg;31QE5(B,$BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B9b8+J]@6(B($BN)65Bg(B) $B>.NS0lGn(B(NIMS) $BJ?HxIRM:(B,$B0KF#5W5A(B($B9b:j868&(B) |
Physica B,308-310, p.1226-1229(2001) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
Si(IL+D@^250D^(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation damages of npn Si transisitors by high-tempereture gamma ray and 1-MeV electron irradiation | $BBg;31QE5(B($B7'K\EEGH9b@l(B) $BCfNS@5OB(B($B;0I)EE5!(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $BJ?HxIRM:(B,$B0KF#5W5A(B($B9b:j868&(B) |
Solid State Phenomene,82-84, p.465-470(2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
(I $BF3F~3J;R7g4Y(B |
Impact of high-energy particle irradiation on polycrystalline silicon films | $BBg;31QE5(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $BCfNS@5OB(B($B;0I)EE5!(B) |
Solid State Phenomene,82-84, p.471-476(2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
(IN_X $BF3F~3J;R7g4Y(B |
Radiation effects on n-MOSFETs fabricated in a BiCMOS process | $BBg;31QE5(B,$BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $BCfNS@5OB(B($B;0I)EE5!(B) |
Nucl.Instrum. Methods B,186, p.419-423(2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
CMOS(IC^J^2=(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation damage in flash memory cell | $BBg;31QE5(B,$BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $BCfNS@5OB(B($B;0I)EE5!(B) |
Nucl.Instrum. Methods B,186, p.392-400(2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
(ILW/<-RSX0(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation damage of polycrystalline Silicon films | $BBg;31QE5(B,$BJF2,>-;N(B($B7'K\EEGH9b@l(B) $BCfNS@5OB(B($B;0I)EE5!(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) |
Nucl.Instrum. Methods B,186, p.176-180(2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
$BB?7k>=(I $BF3F~3J;R7g4Y(B |
Defect assessment of irradiated STI diodes | $BBg;31QE5(B,$BMU;3@651(B($B7'K\EEGH9b@l(B) $B>.NS0lGn(B(NIMS) $BCfNS@5OB(B($B;0I)EE5!(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) |
Nucl.Instrum. Methods B,186, p.424-428(2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
STI(I@^250D^(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Effects of mechanical stress on polycrystalline-silicon resistors | $BBg;31QE5(B($B7'K\EEGH9b@l(B) $BCfNS@5OB(B($B;0I)EE5!(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) |
Thin Solid Films, 406/1-2,p.195-199 (2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
(IN_X $BF3F~3J;R7g4Y(B |
Effects of high-temperature gamma ray irradiation on npn Si transisitors | $BBg;31QE5(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $BCfNS@5OB(B($B;0I)EE5!(B) $BJ?HxIRM:(B($B9b:j868&(B) |
Proc. of the 6thEuropean Conf. Radiation Effects on Components and Systems, RADECS 2001, Gronoble France, p.124-126 (2001) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
Si(IDW]<^=@(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation damage induced in Si photodiodes by high-temperature neutron irradiation | $BBg;31QE5(B,$B9bAR7r0lO:(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $BCfNS@5OB(B($B;0I)EE5!(B) $B>eB< |
Proc. of 4th InT.ConF. on Materials for Microelectronics and Nanoengineering, Espoo Finland, p.135-139 (2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
Si(IDW]<^=@(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Influence of irradiation temperature on electron-irradiated STI diodes | $BBg;31QE5(B,$B9bAR7r0lO:(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) |
Proc. of 4th InT.ConF. on Materials for Microelectronics and Nanoengineering, Espoo Finland, p.299-302(2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
STI(I@^250D^(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation damage of MOSFETs by high temperature electoron irradiation | $BBg;31QE5(B,$B9bAR7r0lO:(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) |
Proc. of InT.ConF. on Electrical Enagineering 2002, Jeju Island Korea, p.1287-1290 (2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
MOS(IDW]<^=@(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Irradiation temperature dependence of radiation damage in Si photodiodes | $BBg;31QE5(B,$B9bAR7r0lO:(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B>eB< |
Proc. of InT.ConF. on Electrical Enagineering 2002, Jeju Island Korea,p .1368-1371 (2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
Si(I@^250D^(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Formation and Migration of Helium Bubbles in Fe and Fe-9Cr Alloy | K.Ono,K.Arakawa,K.Hojou ($BEg:,Bg3XAm9gM}9)(B) |
J.Nucl.Mater., 307-311,1507-1512, 2002 |
$B0lHL6(NO8&5f(B FE-TEM, (I25]$B2CB.4o(B |
$B3KM;9gO':`NA(B, (IMX3Q(B, $B>H (IJ^L^Y(B |
Deformation-Enhanced Cu Precipitation in Fe-Cu Alloy Studied by Positron Annihilation Spectroscopy | T.Onitsuka,M.Takenaka,E.Kuramoto, Y.Nagai,M.Hasegawa |
PhyS.Rev. B, Vol.65,(2002) 012204-1$B!A(B012204-4. |
$B868&9b:j(B 3MV(I@]C^Q$B2CB.4o(B |
$B!!(B |
Study of Fundamental Features of Bias Effect in Metals under Irradiation | E.Kuramoto,K.Ohsawa,T.Tsutsumi | J. Nucl. Mat., Vol.307-311 (2002) 982-987. |
$B868&9b:j(B 3MV(I@]C^Q$B2CB.4o(B |
$B!!(B |
$B7k>=Cf$N>H |
$BB"851Q0l(B | $BF|K\J*M}3X2q;o(B, Vol. 58,No.3 (2003) 158-165. |
$B868&9b:j(B 3MV(I@]C^Q(B |
$B!!(B |
Elemental Analysis of Positron Affinitive Site in Materials by Coincidence Doppler Broadening Spectroscopy | Y.Nagai,Z.Tang,H.Ohkubo, K.Takadate,M.Hasegawa |
Rad. PhyS.Chem.,(2003) Accepted for Publication |
$B868&9b:j(B 2$B9f2CB.4o(B |
$BM[EE;R>CLG(B, $B>H |
Positronium in Silica-based Glasses | Y.Sasaki,Y.Nagai,H.Ohkubo, K.Inoue,Z.Tang,M.Hasegawa |
Rad. PhyS.Chem.,(2003) Accepted for Publication |
$B868&9b:j(B 2$B9f2CB.4o(B |
$BM[EE;R>CLG(B, $B>H |
Positronium in Silica-based Glasses | K.Inoue,Y.Sasaki,Y.Nagai, H.Ohkubo,Z.Tang,M.Hasegawa |
Proc. of InT. Workshop on Positron Studies of Defects in Semiconductors (PSSD-2002) Edited by M.Hasegawa, Z.Tang and Y.Nagai, SepT.29-OcT.4,2002, Sendai,Japan |
$B868&9b:j(B 2$B9f2CB.4o(B |
$BM[EE;R>CLG(B, $B>H |
Positron annihilation study of vacancy-solute complex evolution in Fe-based alloys | Y.Nagai,K.Takadate,Z.Tang, H.Ohkubo,H.Sunaga,H.Takizawa, M.Hasegawa |
PhyS.Rev. B 67 (2003) Accepted for Publication |
$B!!(B | $B!!(B |
Optical absorption study of electron-irradiated Czochralski-grown silicon doped with hydrogen | Akiko Nakanishi,Masashi Suezawa, Naoki Fukata ($BElKLBg3X6bB0:`NA8&5f=j(B) |
JpN.J. Appl. PhyS. Vol. 41,No. 6A, 3629-3636,2002 |
2$B9f2CB.4o(B | silicon, electron irradiation, hydrogen, vacancy, optical absorption |
Many optical absorption peaks observed in electron-irradiated n-type Si | M.Suezawa,N.Fukata,T.Mchedlidze, A.Kasuya($BElKLBg3X6bB0:`NA8&5f=j(B) |
J. Appl. PhyS. Vol. 92,No. 11, 6561-6566,2002 |
2$B9f2CB.4o(B | silicon, vacancy, electron- irradiation, optical absorption |
Complexes of point defects and impurities in electron-irradiated n-type Cz-Si pre-doped with hydrogen | A.Nakanishi,N.Fukata,B.Suezawa | PhyS.StaT.Sol. (b)235,No.1,115-120, 2003 |
2$B9f2CB.4o(B | silicon, electron irradiation, hydrogen, vacancy, optical absorption |
Irradiation-induced improvement of crystalline quality of epitaxial Cu/Si(100) films | K.Takahiro,N.Takeshima, K.Kawatsura($B5~ET9)A!Bg9)7](B) S.Nagata($BElKLBg6b8&(B) S.Yamamoto,H.Naramoto($B868&(B) |
SurF.CoaT.Technol. 158-159,334-338,2002 |
$B868&9b:j(B (I25]$BCmF~4o(B |
(I25]$B>H (I25]A,HX]8^(B |
Structure of amorphized C60 films studied by Raman spectroscopy and X-ray photoelectron spectroscopy | R.Ookawa,K.Takahiro, K.Kawatsura($B5~ET9)A!Bg9)7](B) F.Nishiyama($B9-EgBg9)(B) S.Yamamoto,H.Naramoto($B868&(B) |
Nucl. InstR. MetH. B 206,175-178,2003 |
$B868&9b:j(B (I25]$BCmF~4o(B |
(I1SYL'=$B2=2aDx(B, (IN_XO0$B2=2aDx(B, $B#X@~8wEE;RJ,8wK!(B |
Surface morphology of glassy carbon irradiated with nitrogen ions | K.Takahiro,R.Ookawa, K.Kawatsura($B5~ET9)A!Bg9)7](B) F.Nishiyama($B9-EgBg9)(B) S.Nagata($BElKLBg6b8&(B) S.Yamamoto,K.Narumi, H.Naramoto($B868&(B) M.Iwaki($BM}8&(B) |
Nucl. InstR.MetH. B 206,206-210,2003 |
$B868&9b:j(B (I25]$BCmF~4o(B |
(I6^W=$B>uC:AG(B, $BCbAG(I25]$BCmF~(B, $BI=LL7ABV(B |
Formation of CuCl and AgCl nanoclusters by sequential implantation | K.Takahiro, K.Kawatsura($B5~ET9)A!Bg9)7](B) S.Nagata($BElKLBg6b8&(B) S.Yamamoto,H.Naramoto($B868&(B) M.Sasase,Y.Ito($B |
Nucl. InstR.MetH. B 206,639-643,2003 |
$B868&9b:j(B (I25]$BCmF~4o(B |
CuCl,AgCl, (IEI8W=@0(B, $BC`$BNe5/;R(B |
Radiation damage in Si photodiodes by high temperature irradiation | $BBg;31QE5(B,$B9bAR7r0lO:(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B>eB< |
Proc. of E-MRS 2002 Spring Meeting, Strasbourg France, p.17 (2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
Si(IL+D@^250D^(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Effects of irradiation temperature on radiation damage in electron-irradiated MOS FE | $BBg;31QE5(B,$B9bAR7r0lO:(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) |
Proc. of 8th InT.Conf. on Electronic Materials (IUMRS-ICEM2002) Xi'an China, p. 494(2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
MOSFET, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation damage of Si photodides by high-temperature irradiation | $BBg;31QE5(B,$B9bAR7r0lO:(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B>eB< |
Proc. of 8th InT.ConF. on Electronic Materials (IUMRS-ICEM2002) Xi'an China, p. 495 (2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
Si(IL+D@^250D^(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Irradiation temperature dependence of radiation damage in STI diodes | $BBg;31QE5(B,$B9bAR7r0lO:(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys, A.Poyai(IMEC,(IM^Y7^0(B) |
Proc. of 8th InT.ConF.on Electronic Materials (IUMRS-ICEM2002) Xi'an China,p. 487(2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
STI(I@^250D^(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation damage in deep submicron MOSFETs by high-temperature electron irradiation | $BBg;31QE5(B,$B9bAR7r0lO:(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys, A.Poyai(IMEC,(IM^Y7^0(B) |
Proc. of the 21th Electronics Materials Symposium, Izu-Nagaoka, p.199-200 (2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
MOSFET, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation damages in STI diodes after high temperature electron-irradiation | $BBg;31QE5(B,$B9bAR7r0lO:(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys, A.Poyai(IMEC,(IM^Y7^0(B) |
Proc. of the RADECS workshop, Radiation and its Effects on Components and Systems, Padova Italy, September 19-20, p.121-123(2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
STI(I@^250D^(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Model for the radiation degradation of polycrystalline silicon films | $BBg;31QE5(B,$B9bAR7r0lO:(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys, A.Poyai(IMEC,(IM^Y7^0(B) $BCfNS@5OB(B($B;0I)EE5!(B) |
Proc. of the RADECS workshop, Radiation and its Effects on Components and Systems, Padova Italy, September 19-20, 111-114 (2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
(IN_X $BF3F~3J;R7g4Y(B |
Effects of high-temperature electron irradiation on submicron MOSFETs | $BBg;31QE5(B,$B9bAR7r0lO:(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys, A.Poyai(IMEC,(IM^Y7^0(B) |
Proc. of the RADECS workshop, Radiation and its Effects on Components and Systems, Padova Italy, September 19-20, p.107-109(2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
MOSFET, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B, $B9b29EE;R@~>H |
Degradation behaviors of high-temperature irradiated Si photodiodes | $BBg;31QE5(B,$BMU;3@651(B($B7'K\EEGH9b@l(B) | Proc. of the 3rd Jpan-Korea Joint workshop on advanced semiconductor processes nd equipments, p.123-124 (2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
MOSFET, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B, $B9b29EE;R@~>H |
The future SOI CMOS as COT devices for space application | $BBg;31QE5(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) |
Proc. of the 5th InT.workshop on radiation effects on semiconductor devices for sapce application, p.53-60 (2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
MOSFET, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B, $B9b29EE;R@~>H |
Degradation behaviors for high-temperature irradiated npn Si transistors | $BBg;31QE5(B,$B9bAR7r0lO:(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys, A.Poyai(IMEC,(IM^Y7^0(B) |
Proc. of the 5th InT.workshop on radiation effects on semiconductor devices for sapce application, p.89-92 (2002) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
Si(IDW]<^=@(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B, $B9b29EE;R@~>H |
Damage coefficient in high-temperature particle- and g-irradiated silicon p-i-n diode | $BBg;31QE5(B,$B9bAR7r0lO:(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B5WJ];3CR;K(B,$B>>ED=cIW(B,$B=P8}BY(B ($B1'Ch3+H/;v6HCD(B) |
Appl. PhyS.Lett.,82, p.296-298 (2003) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
Si(IL+D@^250D^(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B, $B9b29EE;R@~>H |
Radiation damage in Si photodiodes by high temperature irradiation | $BBg;31QE5(B,$B9bAR7r0lO:(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) |
Physica E 16, p.533-538 (2003) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
Si(IL+D@^250D^(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B, $B9b29EE;R@~>H |
Effects of irradiation temperature on radiation damage in electron-irradiated MOS FETs | $BBg;31QE5(B,$B9bAR7r0lO:(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) |
Microelectronic Engineering,66, p.530-535 (2003) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
MOSFET, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B, $B9b29EE;R@~>H |
Radiation damage of Si photodides by high-temperature rradiation | $BBg;31QE5(B,$B9bAR7r0lO:(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) |
Microelectronic Engineering,66, p.536-541(2003) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
Si(IL+D@^250D^(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B, $B9b29EE;R@~>H |
Irradiation temperature dependence of radiation damage in STI diodes | $BBg;31QE5(B,$B9bAR7r0lO:(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys, A.Poyai(IMEC,(IM^Y7^0(B) |
Microelectronic Engineering,66, p.517-521(2003) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
STI(I@^250D^(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B, $B9b29EE;R@~>H |
Impact of 20MeV alpha ray irradiation on theV-band performance of AlGaAs psuedomorphic HEMTs | $BBg;31QE5(B,$BJF2,>-;N(B($B7'K\EEGH9b@l(B) K.Yajima,T.Kato, $BCfNS@5OB(B($B;0I)EE5!(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B9b8+J]@6(B($BN)65Bg(B) $B>.NS0lGn(B(NIMS) $BBm_7=U4n(B($B9b:j868&(B) |
IEEE Trans. on Nucl. and Sci.,47, p.2546-2550 (2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
HEMT(IC^J^2=(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Vortex phase transition and correlation in partially Au-ion irradiated YBa2Cu3O7 films | T.Nojima,J.Z.Liu,T.Nishizaki, S.Okayasu,N.Kobayashi |
Physuca C 357-360 (2001) 469-472 |
$B!!(B | $B!!(B |
Effwct of weaK.point disorder on vortex matter phase diagram in untwined YBa2Cu3Oy single crystals | Terukazu Nishizaki, Tomoyuki Naito,Satoru Okayasu, Akihiro Iwase,Norio Kobayashi |
PHYSICAL REVIEW B VOLUME 61, NUMBER 5 1 FEBRUARY 2000-$B-5(B |
$B!!(B | $B!!(B |
VORYEX PHASE DIAGRAM OF Yba2Cu3Oy IN HIGH MAGNETIC FUELDS-EFFECTS OF WEAK.DISORDER- | N.KOBAYASHI,T.NISHIZAKI, K.SHIBATA,S.OKAYASU,A.IWASE, S.SAKATSUME |
Physical Phenomena at High Magnetic Fields-$B-7(B24-27 Octobor 1998 |
$B!!(B | $B!!(B |
ELECTRON IRRADIATION EFFECTS ON THE VORTEX PHASE DIAGRAM IN UNWINNED Yba2 Cu3Oy | Terukazu Nishizaki, Tomoyuki Naito,Satoru Okayasu, Akihiro Iwase,Norio Kobayashi |
Advances in Superconductivity $B->-5(B Proc. of the 11th InT.Symposium on Superconductivity (ISS 98) Novenber 16-19, 1998,Fukuoka |
$B!!(B | $B!!(B |
VORTEX PHASE DIAGRAM IN HIGT-Tc SUPERCONDUCTOR YBa2 Cu3 Oy | N.KOBAYASHI,T.NISHIZAKI, T.NAITO,K.SHIBATA,M.MAKI, S.OKAYASU,A.IWASE |
Proc. of the Third RENCONTERS DU VIETNAM Hanoi,Vietnam, January 4-10,1999 |
$B!!(B | $B!!(B |
He$B%,%9Cf$GEE;R@~$r>H |
$B?.;39n5A(B,$BF#ED@.N4(B($BH,8M9)6HBg(B) | $BJ?@.(B13$BG/EYEE5$4X783X2q(B $BElKL;YItO"9gBg2q(B $B9V1iO@J8=8(B,1F-14, p.186 (2001.8) |
1$B9f2CB.4o(B | $BEE;R@~>H |
PEEK$B$NM6EEFC@-$K5Z$\$9EE;R@~>H |
$B?.;39n5A(B,$BGO>l@?(B, $BF#ED@.N4(B($BH,8M9)6HBg(B) |
$BJ?@.(B12$BG/EE5$3X2q(B $BA49qBg2q9V1iO@J8=8(B[2], 2-028,p.579 (2001.3) |
2$B9f2CB.4o(B | $BEE;R@~>H |
$BEE;R@~>H |
$B?.;39n5A(B,$BGO>l@?(B, $BF#ED@.N4(B($BH,8M9)6HBg(B) |
$BH,8M9)6HBg3X5*MW(B, $BBh(B20$B4,(B,No.20, pp.117-122 (2001.2) |
2$B9f2CB.4o(B | $BEE;R@~>H |
$BEE;R@~$r>H |
$B?.;39n5A(B,$BGO>l@?(B, $BF#ED@.N4(B($BH,8M9)6HBg(B) |
$BJ?@.(B12$BG/EYEE5$4X783X2q(B $BElKL;YItO"9gBg2q(B $B9V1iO@J8=8(B,2F-17,p. (2000.8) |
2$B9f2CB.4o(B | $BEE;R@~>H $BG.J,@O(B |
$BEE;R@~$r>H |
$BEDCf7=0l(B,$B?{86BvLi(B,$B?.;39n5A(B, $BGO>l@?(B,$BF#ED@.N4(B($BH,8M9)6HBg(B) |
$BJ?@.(B12$BG/EYEE5$4X783X2q(B $BElKL;YItO"9gBg2q(B $B9V1iO@J8=8(B,2F-19,p.242 (2000.8) |
2$B9f2CB.4o(B | $BEE;R@~>H |
PEEK$B$NM6EEFC@-$K5Z$\$9EE;R@~>H |
$B?.;39n5A(B,$BGO>l@?(B, $BF#ED@.N4(B($BH,8M9)6HBg(B) |
$BJ?@.(B12$BG/EE5$3X2q(B $BA49qBg2q9V1iO@J8=8(B[2], 2-028,p.579(2000.3) |
2$B9f2CB.4o(B | $BEE;R@~>H |
Dielectric Relaxation Phenomena of Electron Beam Irradiated Polyetheretherketone | K.Shinyama,M.Baba and S.Fujita ($BH,8M9)6HBg(B) |
The Bulletin of Hachinohe Institute of Technology, Vol.19,No.19, p.77-83(2000.2) |
2$B9f2CB.4o(B | $BEE;R@~>H |
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Cathodoluminescence (CL) measurement of radiation-damage halos in low-quartz with various occurence after He+ ion implantation: an attempt to geodosimetry. | Toyoda,S.,Horikawa,Y., Komuro,K.($B2,;3M}Bg(B,$BC^GHBg(B) |
LED2002,10th InT.ConF. on Luminescence and Electtron spinresonance Dating. Reno, Nevada, June24-28, abstract,180 (2002) |
$B868&9b:j(B 3MV(I@]C^Q$B2CB.4o(B |
radiation-damage halos, geodosimeter, low-quartz, cathodo- luminescence, He+ ion implantation |
Influence of mechanaical stress on electricalperformance in polycrystalline-silicon resistors | $BBg;31QE5(B($B7'K\EEGH9b@l(B) $BCfNS@5OB(B,M.Ikegami($B;0I)EE5!(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B>.NS0lGn(B(NIMS) |
Proc. of Materials Research Society's Spring 2000 Meeting, San Francisco,USA, 364,p.250-254 (2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
$BB?7k>=(I $BF3F~3J;R7g4Y(B |
High-energy boron-mplantation and proton-irradiation effects in diodes with shallowtrench isolation | $BBg;31QE5(B,$BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys,A.Poyai, M.kokkoris,E.Kossionides, G.Fanourakis(IMEC,(IM^Y7^0(B) |
Proc. of the 2nd EuropeanNetwork. on Defect Engineering of Advanced Semiconductort Devices, Stockholm Sweden, p.193-203,(2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
Si(IC^J^2=(B,STI, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Proceeding of the Radiation and its Effects on Components and System RADECS 99,Fontevraud France | $BBg;31QE5(B,$BGnB?E/:H(B, T.Tajiri($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B9uED<"(B($BIY;NDL(I6]@QC^J^2=(B) $B9b8+J]@6(B($BN)65Bg(B) |
Proc. of the Radiation and its Effects on Components and System RADECS 99, Fontevraud France, p.295-299(2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
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Degradation and recovery of AlGaAS/GaAs p-HEMTs by high energy particles | $BBg;31QE5(B,$BGnB?E/:H(B, $B;g3@0lDg(B($B7'K\EEGH9b@l(B) $B>.NS0lGn(B(NIMS) $B5\86K.9,(B($B7'Bg(B) H.Takizawa($B9b:j868&(B) $B>e>2H~Li(B($BElBg(B) |
Proc. of the 19th Electronics Materila Symposium, Izu-Nagaoka Japan, p.11-14 (2000) |
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HEMT(IC^J^2=(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Effects of leakage current compensation on neutruon irradiated analog CMOS integrated circuit | $BBg;31QE5(B,$BMU;3@651(B($B7'K\EEGH9b@l(B) $B>.NS0lGn(B(NIMS) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B9b8+J]@6(B($BN)65Bg(B) |
Proc. of the 19th Electronics Materilas Symposium, Izu-Nagaoka Japan, p.15-16(2000) |
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Degradation of electron-irradiated shallow trench isolation diodes | $BBg;31QE5(B,$BJF2,>-;N(B,$BMU;3@651(B, $BEDCf7I;K(B($B7'K\EEGH9b@l(B) $B>.NS0lGn(B(NIMS) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) H.Takizawa$B9b:j868&(B) |
Proc. of the 19thElectronics Materilas Symposium, Izu-Nagaoka Japan, p.17-18(2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
Si(IC^J^2=(B,STI, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation damage in InGaAs photodides | $BBg;31QE5(B,$B9)F#M'M5(B,$BFA;3=gLi(B, $B;g3@0lDg(B($B7'K\EEGH9b@l(B) $B>.NS0lGn(B(NIMS) $BF#0f=_9@(B,$B9b8+J]@6(B($BN)65Bg(B) $B>e>2H~Li(B($BElBg(B) |
Proc. of the 19th Electronics Materilas Symposium, Izu-Nagaoka Japan, p.19-20(2000) |
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InGaAs(IC^J^2=(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
20MeV alpha ray irradiation effects in AlGaAspseudomorphic HEMTs | $BBg;31QE5(B($B7'K\EEGH9b@l(B) | Proc. of the Japan-Korea joint workshop on advanced semicondustor processes and equipments, Toyohashi Japan, p.89-90 (2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
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Radiation damage of n-MOSFETs fabricated in a BiCMOS process | $BBg;31QE5(B($B7'K\EEGH9b@l(B) $BCfNS@5OB(B($B;0I)EE5!(B) E.Simoen(IMEC,(IM^Y7^0(B) |
Proc. of the 3rd InT.ConF. on Materials for Microelectronics, Dublin Castle Ireland, p.107-110 (2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
MOSFET, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Influence of boron implantation dose on themechanical stress in polycrystalline silicon films | $BBg;31QE5(B,$BJF2,>-;N(B($B7'K\EEGH9b@l(B) $BCfNS@5OB(B,M.Ikegami($B;0I)EE5!(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B9b8+J]@6(B($BN)65Bg(B),$B>.NS0lGn(B(NIMS) $B?\1JGnH~(B,$BBm_7=U4n(B($B9b:j868&(B) |
Proc. of the 3rd InT.ConF. on Material for Microelectronics, Dublin Ireland, p.85-88 (2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
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20MeV alpha ray effects in AlGaAs p-HEMTs | $BBg;31QE5(B,$BJF2,>-;N(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B9b8+J]@6(B($BN)65Bg(B),$B>.NS0lGn(B(NIMS) $BLpEh9'B@O:(B,$BCfNS@5OB(B($B;0I)EE5!(B) $B?\1JGnH~(B,($B9b:j868&(B) |
Proc. of the 4rd InT. Workshop on Radiation Effects on Semiconductor Devices for Space Applications, Tsukuba Japan, p.133-138 (2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
HEMT(IC^J^2=(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation performance of shallow trench isolation | $BBg;31QE5(B,$BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,A.Poyai,C.Claeys, A.Mohammadzadeh(IMEC,(IM^Y7^0(B) $B>.NS0lGn(B(NIMS) |
Proc. of the 4th InT.Workshop on Radiation Effects on Semiconductor Devices for Space Applications, Tsukuba Japan, p.19-24 (2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
Si(IC^J^2=(B, STI, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation performance of deep submicron CMOS technologies for space applications | $BBg;31QE5(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys, A.Mohammadzadeh(IMEC,(IM^Y7^0(B) |
Proc. of the 4th Intertnational Workshop on Radiation Effects on Semiconductor Devices for Space Applications, Tsukuba Japan, p.113-119 (2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
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Impact of lattice defects on device performance of AlGaAs /GaAs p-HEMTs | $BBg;31QE5(B,$BGnB?E/:H(B, $B9)F#M'M5(B($B7'K\EEGH9b@l(B) $B>.NS0lGn(B(NIMS) $BBm_7=U4n(B($B9b:j868&(B) $B>e>2H~Li(B($BElBg(B) |
Proc. of the 6th InT.workshop on beam injection assessment of microstructures in semiconductors, Fukuoka,Japan,p.34 (2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
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Negative photocinductivity in polycrystalline silicon films doped with phosphorus | $BBg;31QE5(B,$BJF2,>-;N(B($B7'K\EEGH9b@l(B) $BCfNS@5OB(B($B;0I)EE5!(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B>.NS0lGn(B(NIMS),$B9b8+J]@6(B($BN)65Bg(B) $B?\1JGnH~(B,H.Takizawa($B9b:j868&(B) |
Proc. of the 6th intertnational workshop on beam injection assessment of microstructures in semiconductors, Fukuoka,Japan, p.60 (2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
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Effect of lattice defects on degradation offlash memory cell | $BBg;31QE5(B,$BJF2,>-;N(B,$B9)F#M'M5(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) $B>.NS0lGn(B(NIMS),$BCfNS@5OB(B($B;0I)EE5!(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B8E1H=EH~(B($B6e9)Bg(B) |
Proc. of the 6th intertnational workshop on beam injection assessment of microstructures in semiconductors, Fukuoka,Japan, p.61 (2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
FLASH(IRSX(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation induced defects in n-MOSFETs and their effects on device performance | $BBg;31QE5(B,$BJF2,>-;N(B, $BMU;3@651(B($B7'K\EEGH9b@l(B) $B>.NS0lGn(B(NIMS) $BCfNS@5OB(B($B;0I)EE5!(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B9b8+J]@6(B($BN)65Bg(B) $B8E1H=EH~(B($B6e9)Bg(B) |
Proc. of the 6th InT.workshop on beam injection assessment of microstructures in semiconductors, Fukuoka,Japan, p.70 (2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
MOSFET, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Assessment of radiation induced lattice defects in shallow trench isolation diodes irradiated by neutoron | $BBg;31QE5(B,$BMU;3@651(B($B7'K\EEGH9b@l(B) $B>.NS0lGn(B(NIMS),$B9b8+J]@6(B($BN)65Bg(B) A.Poyai,E.Simoen,C.Claeys, A.Mohammadzadeh(IMEC,(IM^Y7^0(B) $B8E1H=EH~(B($B6e9)Bg(B) |
Proc. of the 6th intertnational workshop on beam injection assessment of microstructures in semiconductors, Fukuoka,Japan,p.71(2000) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
STI, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Studies of degradation mechnism for InGa0.53As0.47p-i-n photodiodes | $BBg;31QE5(B($B7'K\EEGH9b@l(B) $B>.LnEDG&(B,$BJ?HxIRM:(B,$B0KF#5W5A(B, J.S.Laird($B9b:j868&(B) |
Proc. of the RADECS 2000 workshop, Radiation Effects on Components and Systems, Belgium,p.105-109,2000 |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
(IL+D@^250D^(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Study on mechnical stress on the electrical perfromance of polycrystalline-silicon resistors | $BBg;31QE5(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $BCfNS@5OB(B($B;0I)EE5!(B) |
J. Materials Reserch, 16,p.2579-2582 (2001) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
(IN_X $BF3F~3J;R7g4Y(B |
Radiation damage of polycrystalline Silicon films | $BBg;31QE5(B,$BMU;3@651(B($B7'K\EEGH9b@l(B) | Proc. of 2001Korea-Japan Joint Workshop on Advanced Semiconductor Process and Equipments, p.165-166,2001 |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
(IN_X $BF3F~3J;R7g4Y(B |
Radiation damage in Shallow Trench Isolation Diodes | $BBg;31QE5(B,$BMU;3@651(B($B7'K\EEGH9b@l(B) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $B>.NS0lGn(B(NIMS) |
Proc. of InT.ConF.on Electrical Engineering, ICEE 2001, p.1720-1723 (2001) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
STI(IC^J^2=(B, $BFC@-Nt2=(B, $BF3F~3J;R7g4Y(B |
Radiation effects on Polycrystalline Silicon Films | $BBg;31QE5(B,$BMU;3@651(B($B7'K\EEGH9b@l(B) $B>.NS0lGn(B(NIMS) E.Simoen,C.Claeys(IMEC,(IM^Y7^0(B) $BCfNS@5OB(B($B;0I)EE5!(B) |
Proc. of InT.ConF.on Electrical Engineering, ICEE 2001, p.1863-1866 (2001) |
$B9b:j868&(B ($BEE;R2CB.4o(B, TIARA) |
(IN_X $BF3F~3J;R7g4Y(B |
Irradiation Induced Vacancy-Cu Aggregations in Fe-Cu and Fe-Cu-Ni Model Alloys of Reactor Pressure Vessel Steels Studied by Positron Annihilation | Y.Nagai,K.Takadate,Z.Tang, H.Ohkubo,M.Hasegawa |
Effect of Radiation on Materials, ASTM STP 1447, M.L. Grossbeck, Ed.,ASTM Int., West Conshohocken, PA,2003 |
$B!!(B | $B!!(B |
ECCO$B7W2h$K$*$1$k(BGCR$BD6=E3KN3;R%H%i%C%-%s%0$rL\E*$H$7$?(BBP-1$B%,%i%9Ht@W8!=P4o%T%s%[!<%k8!=PK!$N3+H/(B-2 | S.Nakamura,T.Kitamura, Y.Watanabe($B2#IM9qBg9)3XI\(B) M.Sekiguchi, K.Namiki($BElK.BgM}3XIt(B) H.Tawara($B9b%(8&(B) N.Yasuda($BJ|0e8&(B) T.Doke($BAaBgM}9)Am8&(B) |
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BP-1$B%,%i%9Ht@W8!=P4o$N??6u;g308w$rMQ$$$?%T%s%[!<%k%9%-%c%s(B-2 | S.Nakamura,T.Kitamura, Y.Watanabe($B2#IM9qBg9)3XI\(B) M.Sekiguchi, K.Namiki($BElK.BgM}3XIt(B) H.Tawara($B9b%(8&(B) N.Yasuda($BJ|0e8&(B) T.Doke($BAaBgM}9)Am8&(B) |
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$B5FCSM:0lO:(B,$B>.EhCRLi(B,$B?.;39n5A(B, $BF#ED@.N4(B($BH,8M9)6HBg3X(B) |
$BJ?@.(B14$BG/EYEE5$4X783X2q(B $BElKL;YItO"9gBg2q(B $B9V1iO@J8=8(B,2C-7,p. 94 (2002.8) |
1$B9f2CB.4o(B | $BEE;R@~>H |
He$B%,%9Cf$GEE;R@~>H |
$B?.;39n5A(B,$BF#ED@.N4(B($BH,8M9)6HBg3X(B) | $BH,8M9)6HBg3X5*MW(B,$BBh(B21$B4,(B, No.21,pp.103-108 (2002.2) |
1$B9f2CB.4o(B | $BEE;R@~>H |
An attempt to make a cathodoluminescence(CL) geodosimeter: CL measurement of synthetic and natural quartz after He + implantation | Horikawa,Y.,Komuro,K. and Toyoda,S.($BC^GHBg(B,$B2,;3M}Bg(B) |
$BCO5eOG@12J3X4XO"3X2q(B 2002$BG/9gF13X2q(B, G004-011,(2002) |
$B868&9b:j(B 3MV(I@]C^Q$B2CB.4o(B |
radiation-damage halos, geodosimeter, low-quartz, cathodo- luminescence, He+ ion implantation |
Measurement conditions for radiation-damage halos in low-quartz using cathodoluminescence microscope and cooled CCD camera. | Horikawa,Y.,Komuro,K.($BC^GHBg(B) | $BCO5eOG@12J3X4XO"3X2q(B 2002$BG/9gF13X2q(B, G004-P002,(2002) |
$B868&9b:j(B 3MV(I@]C^Q$B2CB.4o(B |
radiation-damage halos, CCD camera, low-quartz, cathodo- luminescence |
$BO@J8L>(B | $BCx |
$B7G:\;oL>(B $B4,9f(I%$B%Z!<%8(I%$BH/9TG/(B |
$BMxMQ;\@_(B | $B%-!<%o!<%I(B |
Cell cycle dependence of boron uptake from two boron compounds used for clinical neutron capture therapy | Yoshida F,Matsumura A, Shibata Y,Yamamoto T, Nakauchi H,Okumura M,Nose T |
Cancer Lett 187: 135-141,2002 |
$B!!(B | $B!!(B |
Comparison of two Brain Tumor-Localizing MRI Agents$B!'(BGD-BOPTA and GD-DTPA .The study of Magnetic Resonance Imaging and Inductively Coupled Plasma Atomic Emission Spectroscopy with Rat Brain tumors. | Zhang T,Matsumura A, Yamamoto T,Yoshida F, Nose T,Shimojo N |
AJNR Am J Neuroradiol 23: 15-18,2002 |
$B!!(B | $B!!(B |
In-phantom two-dimensional thermal neutron distribution for intraoperative boron neutron capture therapy of brain tumours. | Yamamoto T,Matsumura A, Yamamoto K,Kumada H, Shibata Y,Nose T |
Phys Med Biol 47: 1-10,2002 |
$B!!(B | $B!!(B |
Effect of expression of p-glycoprotein on Technetium-99m Methoxyisobutylisonitrle single photon emission computed tomography of brain tumors. | Shibata Y,Matsumura A,Nose T | Neuro Med Chir (Tokyo)42: 325-330,2002 |
$B!!(B | $B!!(B |
$BG.(I%$BG.30:.9g%S!<%`$rMQ$$$?=QCfboAGCf@-;RJaB*NEK!(B | $B;3K\E/:H(B,$B>>B |
Neuro-Oncology 12: 88-90,2002 |
$B!!(B | $B!!(B |
Comparison of patient brain dose measurements and the JCDS calculatioN.Research and Development in Neutron Capture Therapy | Yamamoto T,Matsumura A, Yamamoto K,Kumada H,Torii Y, Endo K,Matsushita A,Shibata Y, Nose T |
Research and Development in Neutron Capture Therapy, p.415-418,2002 |
$B!!(B | $B!!(B |
Comparison pf dosimetry by the realistic patient head phantom and by the patient's brain,and the JCDS calculation ? a clinical dosimetry study. | Endo K,Matsumura A,Yamamoto T, Nose T,Yamamoto K,Kumada H, Kishi T,Torii Y,Kashimura T, Ohtake S |
Research and Development in Neutron Capture Therapy,p.425-430,2002 |
$B!!(B | $B!!(B |
Simple estimation method of gamma-ray dose using low neutron-sensitive TLD (UD-170LS) for intra-operative boron neutron capture therapy (IOBNCT). Research and Development in Neutron Capture Therapy | Yamamoto K,Kumada H,Torii Y, Kishi T,Yamamoto T,Matsumura A |
Research and Development in Neutron Capture Therapy,p.499-503, 2002 |
$B!!(B | $B!!(B |
Verification of the JAERI computational dosimetry system for neutron capture therapy. Research and Development in Neutron Capture Therapy | Kumada H,Matsumura A, Nakazawa Y,Yamamoto T, Yamamoto K,Torii Y |
Research and Development in Neutron Capture Therapy,p.529-534, 2002 |
$B!!(B | $B!!(B |
In-air radiobiological dosimetry of JRR-4 neutron beams for boron neutron capture therapy. | Yamamoto T,Matsumura A, Yamamoto K,Kumada H,Hori N, Torii Y,Endo K,Matsushita A, Yoshida F,Shibata Y,Nose T |
Research and Development in Neutron Capture Therapy,p.697-700, 2002 |
$B!!(B | $B!!(B |
A comparison of in Vivo Gd-NCT trial by using two targeting compounds: Gd-BOPTA and Gd-DTPA. | Zhang T,Matsumura A, Yamamoto T,Yoshida F, Sakurai Y,Kobayashi T, Ono K,Nose T |
Research and Development in Neutron Capture Therapy,p.807-812, 2002 |
$B!!(B | $B!!(B |
A combination use of boron and gadolinium compounds in In Vitro NCT trial. Research and Development in Neutron Capture Therapy | Zhang T,Matsumura A,Yamamoto T, Yoshida F,Sakurai Y,Kumada H, Yamamoto K,Nose T |
Research and Development in Neutron Capture Therapy,p.819-824, 2002 |
$B!!(B | $B!!(B |
Chronological changes of boron uptake and its relationship to the cell cycle$B!%(BAn In Vitro study of different cell lines. | Yoshida F,Matsumura A, Shibata Y,Yamamoto T, Zhang T,Nakauchi H,Okumura M, Nose T |
Research and Development in Neutron Capture Therapy,p.857-860, 2002 |
$B!!(B | $B!!(B |
The prediction of boron concentrations in blood for patients of boron neutron capture therapy (2ndreport) | Shibata Y,Matsumura A, Yamamoto T,Akutsu H,Yasuda S, Nakai K,Nose T,Yamamoto K, Kumada H,Hori N,Ohtake S |
Research and Development in Neutron Capture Therapy,p.1055-1060, 2002 |
$B!!(B | $B!!(B |
Intraoperative boron neutron capture therapy using thermal/epithermal mixed beam. | Matsumura A,Yamamoto T, Shibata Y,Nakai K,Zhang T, Matsushita A,Takano S,Endo K, Akutsu H,Yamamoto K,Kumada H, Torii Y,Mizutani T,Takahashi H, Toyooka H,Nose T |
Research and Development in Neutron Capture Therapy,p.1073-1078, 2002 |
$B!!(B | $B!!(B |
Failure pattern in the patients who underwent intraoperative boron neutron capture therapy(IOBNCT). | Nakai K,Matsumura A,Yamamoto T, Shibata Y,Zhang T,Akutsu H, Matsuda M,Matsushita A,Yasuda S, Takano S,Nose T,Yamamoto K, Kumada H,Torii Y |
Research and Development in Neutron Capture Therapy,p.1135-1138, 2002 |
$B!!(B | $B!!(B |
Therapeutic Synergy of Anti-VEGF Antibody and ACNU Chemotherapy: Effects on Tumor Growth and Angiogenesis in Human Glioblastoma Xenografts. | Takano S,Tsuboi K,Matsumura A, Nose T |
$B%]%9%H%7!<%/%(%s%9;~Be(B $B$K$*$1$kG> |
$B!!(B | $B!!(B |
$B:.9gG.(I%$BG.30Cf@-;R$rMQ$$$?0-@-?@7Pg1 | $B>>B $B>>2 $BK-2,=(71(B,$B;3K\OB4n(B,$B7'EDGnL@(B, $BD;5o5ALi(B |
$B%]%9%H%7!<%/%(%s%9;~Be(B $B$K$*$1$kG> |
$B!!(B | $B!!(B |
$B%,%l%j%*%A%c%s%M%k(I"$BCN$l$P?H6a$K!AJ| |
$B>>B |
2002.5.26$BJ|Aw(B $BEl5~(BMX$B!](BTV ($B%$%s%?%S%e!<=P1i(B) |
$B!!(B | $B!!(B |
Characterization of Neutron Beams for Boron Neutron Capture Therapy$B!'(BIn-air Radiobiological Dosimetry. | Yamamoto T,Matsumura A, Shibata Y,Nose T,Yamamoto K, Kumada H |
$B8&5fO'MxMQ$K$*$1$k(B $B8&5f@.2L=8(B($BJ?@.(B12$BG/EY(B) JAERI-Review2002-014: p.459-461,2002 |
$B!!(B | $B!!(B |
In Vivo Neutron Measurement on the Human Brain and Blood Boron Measuremnt for Intraoperative Boron Neutron Capture Therapy (IOBNCT) | Yamamoto T,Matsumura A, Shibata Y,Nose T,Yamamoto K, Kumada H |
$B8&5fO'MxMQ$K$*$1$k(B $B8&5f@.2L=8(B($BJ?@.(B12$BG/EY(B) JAERI-Review 2002-014: p463-64,2002 |
$B!!(B | $B!!(B |
Current Medical Setup at JRR-4 for Boron Neutron Capture Therapy (BNCT). | Yamamoto T,Matsumura A, Shibata Y,Nose T,Yamamoto K, Kumada H |
$B8&5fO'MxMQ$K$*$1$k(B $B8&5f@.2L=8(B($BJ?@.(B12$BG/EY(B) JAERI-Review 2002-014: p.457-458,2002 |
$B!!(B | $B!!(B |
$BG.%S!<%`(BI$B$rMQ$$$?(BBNCT$B$NNW>2E*8!F$(B - $BBh(B1$BJs(B | $B>>B $B;3K\OB4n(B,$B7'EDGnL@(B,$BKYD>I'(B |
$B8&5fO'MxMQ$K$*$1$k(B $B8&5f@.2L=8(B($BJ?@.(B12$BG/EY(B) JAERI-Review 2002-014: p.465-466,2002 |
$B!!(B | $B!!(B |
Current In vitron NCT comparison between two Gd targeting compound (Gd-BOPTA and Gd-DTPA). | Zhang T,Matsumura A, Yamamoto T,Nose T,Kumada H, Yamamoto K |
$B8&5fO'MxMQ$K$*$1$k(B $B8&5f@.2L=8(B($BJ?@.(B12$BG/EY(B) JAERI-Review 2002-014: p.467-468,2002 |
$B!!(B | $B!!(B |
$B0-@-G> |
$B>>B |
$BBh(B4$B=8(B $B8&5f(I%$B5;=Q%7!<%:=8Am9gHG(B p.34,2002 |
$B!!(B | $B!!(B |
$B |
$B>>B |
$BBh#4=8(B $B8&5f(I%$B5;=Q%7!<%:=8Am9gHG(B p.35,2002 |
$B!!(B | $B!!(B |
JRR-4$BG.30Cf@-;R%S!<%`$N(Bin vitro$B@8J*3XE*8z2L!#!]%U%j!<%S!<%`>r7o$J$i$S$K%U%!%s%H%`>r7o$G$NB,Dj!=(B | $B;3K\E/:H(B,$B;3K\OB4n(B,$B>>B $BD;5o5ALi(B,$BKY8}MNFs(B,$BG=@*CiCK(B |
($B6(NO8&5f(B) JAERI-Research 2002-011, $BF|K\86;RNO8&5f=j(B, $BEl3$(B,2002 ($BA4(B56$B%Z!<%8(B) |
$B!!(B | $B!!(B |
In vivo trial of Gd-NCT by using a new gadolinium compound (Gd-BOPTA). | Matsumura A,Zhang T, Yamamoto T,Sakurai Y, Kobayashi T,Ono K,Nose T |
KURRI Prog Rep 2000 Section I: p.153,2001 |
$B!!(B | $B!!(B |
$BO@J8L>(B | $BCx |
$B7G:\;oL>(B $B4,9f(I%$B%Z!<%8(I%$BH/9TG/(B |
$BMxMQ;\@_(B | $B%-!<%o!<%I(B |
$B3$MN$K$*$1$k%[%&AGF10LBN$H(BpH($BAm@b(B) | $BBg=PLP(B,E.Zuleger($BN05eBg3X(B) | $BCO5e2=3X(B 33,115-122 (1999) |
$B!!(B | $B!!(B |
$B%5%s%4>LBO@QJ*$N%9%H%m%s%A%&%`F10LBNG/Be$H3$LLJQF0(B($B2r@b(B) | $BBg=PLP(B($BN05eBg3X(B) | $B7n4)(I%$B3$MN(B/$B9f30(B No.25, 224-230 (2001) |
JRR-3M, JRR-4 |
$B!!(B |
$B%5%s%49|3J$N(B Sr/Ca $B29EY7W(B($BAm@b(B) | $B:4F#M*2p(B,$BBg=PLP(B($BN05eBg3X(B) | $BCO5e2=3X(B 35,1-11(2001) | JRR-4 | $B!!(B |
Instrumental neutron activation analysis of extracTABLE | M.Kawano (Ehime Univ.) J. Falandysz(Univ.Gdansk) T.Wakimoto(Ehime Univ.) |
Journal of Radiochemical Sciences, Vol.2,Supplement,p.76 (2001) |
JRR-4 | $B!!(B |
Instrumental neutron activation analysis of extracTABLE organohalogens (EOX) in Antarctic marine organisms. | Kawano,M.(Ehime Univ.) Falandysz,J.(Univ.$B!!(BGdansk) Wakimoto,T.(Ehime Univ.) |
2001Asia-PacificSymposium on Radiochemistry and 2001 Annual Meeting of the JapanSociety of Nuclear and Radiochemical Science/ The 45th Symposium on Radiochemistry. Proc.. Fukuoka, October 30th - November 1st,20 |
JRR-4 | $B!!(B |
Chemical composition of a drilled core of Lake Biwa in Japan and implications for source changes during the past 430,000 years. | K.Toyoda (Grad. School of Enviro N.Earth Sci., Hokkaido Univ.,Japan) |
Quaternary InT.105 57-69 (2003) |
JRR-3M JRR-4 |
heavy minerals; climate change; tectonic movement |
$B868&O'$rMQ$$$?&A@~%H%i%C%/%(%C%A%s%0K!$K$h$k9]Cf%\%m%s$N>uBVJ,I[4Q;!%7%9%F%`$N3NN)(B | $BD+AR7rB@O:(B,$B |
$BE4$H9](B,89(2003) p.369-374 |
JRR-4 | (IN^[]$BJ,I[(B, $BG.Cf@-;R(B, $BDcJ| $B&A@~(IDW/84/A]8^$BK!(B |
$B&A@~%H%i%C%/%(%C%A%s%0K!$K$*$1$k?d>)%U%#%k%`$NC5:w(B | $BD+AR7rB@O:(B,$B |
$BE4$H9](B,89 (2003) p.375-380 |
JRR-4 | (IN^[]$BJ,I[4Q;!(B, $B>K;@(I>Y[0=L(YQ(B, $BG.Cf@-;R>H $B&A@~(IDW/84/A]8^$BK!(B |
Effects of Nitrogen in 9Cr-3W-3Co Ferritic Heat REsistant Steels Containing Boron | Emad EL-Kashif,K.Asakura, K.Shibata |
ISIJ International,42 (2002) p.1468-1476. |
JRR-4 | $BBQG.9](B,(IN^[](B, $BCbAG(B,(I8X0L_$B6/EY(B, (IP8[$BAH?%(B, $B&A@~(IDW/84/A]8^$BK!(B |
Behavior of boron in 9Cr-3W-3Co ferritic heat resistant steels | Emad EL-Kashif,K.Asakura, K.Shibata |
CAMP-ISIJ,15,3 (2002) 603 |
JRR-4 | $BBQG.9](B,(IN^[](B, $BCbAG(B, (I8X0L_$BGKCG6/EY(B, Larson-Miller (IJ_WR0@(B, $B&A@~(IDW/84/A]8^$BK!(B |
Role of boron in preventing intergranular fracture in interstitial free steels | Emad EL-Kashif,K.Asakura, K.Shibata |
CAMP-ISIJ,15,3 (2002) 604 |
JRR-4 | (IN^[](B,$B$j$s(B, (IN^[]$BJP@O(B, $BNd5QB.EY(B, $B&A@~(IDW/84/A]8^$BK!(B |
$B2~NI(BIncoly 908$B9g6b$N1~NO2 |
$BD+AR7rB@O:(B,$B |
CAMP-ISIJ,15,6 (2002) 1167 |
JRR-4 | Incoloy 908, (IN^[](B,SAGBO, (I8X0L_$B;n83(B, $B&A@~(IDW/84/A]8^$BK!(B |
Effects of nitrogen in 9Cr-3W-3Co ferritic heat resistant Steels containing boron | Emad EL-Kashif,K.Asakura, K.Shibata |
CAMP-ISIJ,15,6 (2002) 1168 |
JRR-4 | $BBQG.9](B,(IN^[](B, $BCbAG(B,(I8X0L_$B6/EY(B, $B&A@~(IDW/84/A]8^$BK!(B |
Grain boundary segregation of boron in interstitial free steels containing phosphorous | Emad EL-Kashif,K.Asakura, K.Shibata |
CAMP-ISIJ,15,6 (2002) 1169 |
JRR-4 | (IN^[](B,$B$j$s(B, (IN^[]$BJP@O(B, $BNd5QB.EY(B, $B&A@~(IDW/84/A]8^$BK!(B |
A study of environmental analysis of urban river sediments using activation analysis | Y.Tanaka,A.Kuno,M.Matsuo (The University of Tokyo) |
J. Radioanal. Nucl. Chem., Articles,255(2) 239-243 (2003) |
JRR-4 PN TB | $BET;T2O@n(B, $BDlPGA$BAj4X78?t(B, $B |
A study on vertical distribution of elements and their chemical states in Yatsu Tideland sediments | M.Kataoka,A.Kuno,M.Matsuo (The University of Tokyo) |
J.Radioanal. Nucl. Chem., Articles,255(2) 283-286(2003) |
JRR-4 PN TB | $BC+DE433c(B, $BDlJ,I[(B, (IJ_2W2D(BINAA, PGA, (IR=J^310$BJ,8wK!(B |
Uranium in pore water from coastal sediments determined by chemical activation analysis. | Hossain M.M.M.,Ohde S. (University of the Ryukyus) |
J.Radioanal. Nucl. Chem.251 (2) 333-336,2002 |
F-ring(TRIGA-$B-6(B) | Uranium, Pore water, Sediment, Chemical activation analysis |
The chronology of Funafuti Atoll: revisiting an old friend. | Ohde S.,Greaves M., Masuzawa T. (University of the Ryukyus) |
Proc. R.Soc. Lond. A,458, 2289-2306,2002 |
JRR-3,JRR-4 | Chronology, Atoll, Strontium, Isotope |
Red TL dating of dune sand deposits from middle to late Pleistocene in Northern Honshu,Japan | Y.Ganzawa,M.Momoi (Hokkaido Univ. of Edu) |
10th InT.ConF. on luminescence and ESR dating.108(2002) |
JRR-4,T(IJ_2L_(B | Pleistocene, Red TL |
Dating of Toya Caldera about 100ka volcanic activities. | Y.Ganzawa,H.Furukawa (Hokkaido Univ. of Edu) |
ESR Applications,17. 51 (2001) |
JRR-4,T(IJ_2L_(B | Toya Caldera, Red TL |
$B9-0hIw@.?PBO@QJ*$N%k%_%M%;%s%9G/BeB,Dj(B | $B4gBt9%Gn$[$+(B ($BKL3$F;650iBg3XH!4[9;(B) |
$BCO |
JRR-4,T(IJ_2L_(B | $BIw@.?PBO@QJ*(B, IRSL$BG/BeB,Dj(B |
$B@P1Q$NG.7V8w%+%i!<2hA|(B(TLCI)$B$H2hA|7V8w(B(TLCI-CIA)$B$K$h$kIw@.G4EZAX$N5/8;?dDj(B | $Brn_79%Gn(B,$B7&KL9L<#(B ($BKL3$F;650iBg3XH!4[9;(B) |
$BBh;M5*8&5f(B,40,403-413 (2001) |
JRR-4,T(IJ_2L_(B | $BIw@.?PBO@QJ*(B, TLCI |
Datation par thermoluminescence d$B!G(Bun niveau de Tephra du volvan TOYA | Y.Ganzawa et al., (Hokkaido Univ. of Edu) |
PCCF RI 0006,1-18 (2000) |
JRR-4,T(IJ_2L_(B | Toya Caldera, Red TL |
Electron spin resonance study of copper biosorption by bacteria | Akira Nakajima | Water Research 36 (2002) 2091-2097 |
$B!!(B | $B!!(B |
A preliminary investigation on the determination of lanthanoids,thorium and uranium in brine and deposit of a salt lake in Chaina | M.Yui,Y.Kikawada,T.Oi, T.Honda,D.Sun,K.Shuai |
Journal of Radioanalycal and Nuclear Chemistry, Vol.231,Nos 1-2 (1998) 83-86 |
$B!!(B | $B!!(B |
Abundance of lanthanoids in rocK.salts determined by neutron activation analysis | M.Yui,Y.Kikawada,Y.Oi, T.Honda,T.Nozaki |
Journal of Radioanalycal and Nuclear Chemistry, Vol.238,Nos 1-2(1998)3-6 |
$B!!(B | $B!!(B |
Abundance of Uranium and Thorium in Rock Salts-Partition of Uranium and Thorium between Solid and Solution Phases in Neutral Environments in Nature- | Mizuaki Yui,Yosikazu Kikawada, Takao Oi,Teruyaki Honda and Tetsuya Nozaki |
Radistopes,Vol.47, No.6 (June 1998) |
$B!!(B | $B!!(B |
$BK\K.Cf@-29@t?eCf$N%i%s%?%N%$%I85AGB8:_NL(B | $BLZ@nED4n0l(B,$BBg0fN4IW(B,$BK\B?>H9,(B | $B29@t2=3XBh(B49$B4,Bh#19f(B (1999) |
$B!!(B | $B!!(B |
$BJ| |
$B>>2 |
$B=$;NO@J8(B(2003$BG/(B2$B7n(B) | JRR-4 | (IR@^6(B, K0$BK!(B |
$B6KDcC:AG9]$NAjJQBV$HHyNL%\%m%s$N1F6A(B | $B;38}OBG7(B | $BEl5~Bg3X=$;NO@J8(B(2003) | JRR-4 | $BDcC:AG9](B, $BAjJQBV(B, (IN^[](B, $B&A@~(IDW/84/A]8^$BK!(B |
$B4D6-1x@w;XI8@8J*$ND4::8&5f!=N&@8Ey5SN`$N8!F$(B | $B@n@>9,;R(B,$BLn@n7{IW(B,$B_7H(9@G7(B, $B?99,;R(B,$BIpB"LnC;4|Bg3X(B) |
$BIpB"LnC;4|Bg3X(B $B8&5f5*MWBh(B15$B9f(B11$B!A(B18$BJG(B |
JRR-3M$B5$Aw4I(B | Armadillidium vnlgare, $B@8J*G;=L(B, $BCf@-;RJ| |
$BCg%N?@Eg;:%+%D%*%I%j(B(Sula leucogaster)$B$K$*$1$k;DN1@-?M9)M-5!1vAG2=9gJ*$HM-5!BV1vAG(B(EOCl)$B$NC_@QFC@-(B | $B2OLn8x1I(B,$B;3K\63;q(B($B0&I2Bg3XG@(B) $B2OLnM5H~(B($BEl3$Bg3X2-FlCO0h8&(B) $BOFK\CiL@(B($B0&I2Bg3XG@(B) |
$BBh(B9$B2s4D6-2=3XF$O@2q(B $B9V1iMW;]=8(B,436-437, $B;%KZ(B,2000$BG/(B6$B7n(B20-22$BF|(B (2000$BG/(B) |
JRR-4 | $B!!(B |
$B1vAG@=B$9)>lIU6a$K@3B)$9$k@8J*Cf$NM-5!BV%O%m%2%s(B(EOX) | $B2OLn8x1I(B($B0&I2Bg3XG@(B) K.$B%+%s%J%s(B($B%_%7%,%s=#N)Bg(B) $B>0f;0L@(B($B2#IM;TN)Bg3X0e(B) J.P.$B%.!<%7!<(B($B%_%7%,%s=#N)Bg(B) $BOFK\CiL@(B($B0&I2Bg3XG@(B) |
$BBh(B37$B2sM}9)3X$K$*$1$k(B $BF10L85AG8&5fH/I=2q(B, $BEl5~(B,$BMW;]=8(B p.174, 2000$BG/(B7$B7n(B3-5$BF|(B |
JRR-4 | $B!!(B |
$BCg%N?@Eg;:%+%D%*%I%j(B(Sula leucogaster)$B$KC_@Q$9$kM-5!BV%O%m%2%s(B(EOX)$B$N5!4oCf@-;RJ| |
$B2OLn8x1I(B($B0&I2Bg3XG@(B) $B2OLnM5H~(B($BEl3$Bg3X2-FlCO0h8&(B) $BOFK\CiL@(B($B0&I2Bg3XG@(B) |
$BBh(B44$B2sJ| $B?@8M(B,2000$BG/(B9$B7n(B12-14$BF|(B (2000$BG/(B) |
JRR-4 | $B!!(B |
$BCg%N?@Eg;:%+%D%*%I%j(B(Sula leucogaster)$B$KC_@Q$9$kM-5!BV%O%m%2%s(B(EOX)$B$N5!4oCf@-;RJ| |
$B2OLn8x1I(B($B0&I2Bg3XG@(B) $B2OLnM5H~(B($BEl3$Bg3X2-FlCO0h8&(B) $BOFK\CiL@(B($B0&I2Bg3XG@(B) |
$BBh(B44$B2sJ| $B?@8M(B,2000$BG/(B9$B7n(B12-14$BF|(B (2000$BG/(B) |
JRR-4 | $B!!(B |
$B%-%"%7%7%.(B(Heteroscelus brevipes)$BM-5!BV%O%m%2%s(B(Cl,Br,I) | $B2OLn8x1I(B,$B>>ED=!L@(B, $BOFK\CiL@(B($B0&I2Bg3XG@(B) |
JAERI-Review 2001-004 $B8&5fO'MxMQ$K$*$1$k(B $B8&5f@.2L=8(B,406-410, $BF|K\86;RNO8&5f=j(B 2001$BG/(B3$B7n(B |
JRR-4 | $B!!(B |
$BL>8E20Bg3X%"%$%=%H!<%WAm9g%;%s%?!<$K@_CV$5$l$?&C@~<+F0B,Dj(I%$B2r@O%7%9%F%`$K$h$kCO | $B $B6aF#@5;K(B,$B?%ED<~J?(B,$BNSN4@5(B, $B@>_7K.=((B,$B>.Eg5W(B |
$BL>8E20Bg3XGnJ*4[Js9p(BNo.17,15-32,2001 | $B!!(B | $B!!(B |
Ko$BI8=`2=J| |
$B>>2 |
$BBh(B49$B2sJ| |
JRR-4 | (IR@^6(B, K0$BK!(B |
$B%T%j%+0d@W(BD$BCOE@%m!<%`AX$N%k%_%M%;%s%9G/BeB,Dj(B | $B4gBt9%Gn(B ($BKL3$F;650iBg3XH!4[9;(B) |
$B:#6bD.J82=:bJs9p=q(B (I"$B%T%j%+0d@W-6(I#(B89-92 (2002) |
JRR-4,T(IJ_2L_(B | $B5l@P4o0d@W(B, IRSL$BG/Be(B |
$BO@J8L>(B | $BCx |
$B7G:\;oL>(B $B4,9f(I%$B%Z!<%8(I%$BH/9TG/(B |
$BMxMQ;\@_(B | $B%-!<%o!<%I(B |
Uranium in pore water from coastal sediments determined by chemical activation analysis. | Hossain M.M.M.,Ohde S. (University of the Ryukyus) |
J. Radioanal. Nucl. Chem.251 (2) 333-336,2002 |
F-ring(TRIGA-$B-6(B) | Uranium, Pore water, Sediment, Chemical activation analysis |
The chronology of Funafuti Atoll: revisiting an old friend. | Ohde S.,Greaves M., Masuzawa T. (University of the Ryukyus) |
Proc. R.Soc. Lond. A,458, 2289-2306,2002 |
JRR-3,JRR-4 | Chronology, Atoll, Strontium, Isotope |
A study of environmental analysis of urban river sediments using activation analysis | Y.Tanaka,A.Kuno and M.Matsuo (The University of Tokyo) |
J. Radioanal. Nucl. Chem., Articles,255(2) 239-243 (2003) |
JRR-3M PGA | $BET;T2O@n(B, $BDlPGA$BAj4X78?t(B, $B |
A study on vertical distribution of elements and their chemical states in Yatsu Tideland sediments | M.Kataoka,A.Kuno and M.Matsuo (The University of Tokyo) |
J. Radioanal. Nucl. Chem., Articles,255(2) 283-286 (2003) |
JRR-3M PGA | $BC+DE433c(B, $BDlJ,I[(B, (IJ_2W2D(BINAA, PGA, (IR=J^310$BJ,8wK!(B |
$BO@J8L>(B | $BCx |
$B7G:\;oL>(B $B4,9f(I%$B%Z!<%8(I%$BH/9TG/(B |
$BMxMQ;\@_(B | $B%-!<%o!<%I(B |
Experience of backward scattered neutron measurements using a neutron sensitive imaging plate. | K.KATO($BF#ED1R@8Bg(B) G.MATSUMOTO($BL>8E20Bg(B) Y.HAGA,N.NIIMURA, M.MATSUBAYASHI($B868&El3$(B) |
Nondestr.Test. Eval.,Vol.16,pp.413-422 (2001) |
JRR-3 | neutron radiography, imaging plate neutron detector, water, mouse, back-scattering |
Void Fraction Distribution Patterns of Steady Air-Water Two-Phase Flow in a Rod Bundle with a Spacer | N.Takenaka,H.Asano, T.Fujii($B?@8MBg(B) K.Yoshii($BEl5~Bg(B) M.Matsubayashi($B868&(B) |
Proc. of the ASME InT. MecH.Eng. Congress and Exposition, HTD-Vol.361-5,297-304, (1998). |
JRR3M,TNRF2$B!!(B | $B5$1UFsAjN.(B, (I[/D^J]D^Y(B, (IN^2D^$BN(7WB,(I=M_0;0(B |
Visualization and Measurement of Refrigerant Flow in Compression-type Refrigerator by Neutron Radiography | H.Asano,N.Takeanaka, T.Fujii($B?@8MBg(B) Y.Shibata,T.Ebisu((I@^27]$B9)6H(B) M.Matsubayashi($B868&(B) |
Nuclear Instruments and Methods in Physics Research-A,Vol.424, No.1,92-97,(1999). |
JRR3M,TNRF2 | $B5$1UFsAjN.(B, $BNdG^N.$l(B, $BNdE`5!(B, $BJ,N.4o(B, (I7,K_WX0A-0L^(B |
Flow Pattern of Gas-Liquid Two-Phase Annular Flow in a Spiral Tube | H.Asano,N.Takeanaka,T.Fujii, T.Arakawa($B?@8MBg(B) M.Matsubayashi($B868&(B) |
Proc. of the ASME InT. MecH.Eng.Congress and Exposition, HTD-Vol.361-5,297-304, (1998). |
JRR3M,TNRF2 | $B5$1UFsAjN.(B, (I=J_2WY$B4I(B, $BN.F0MM<0(B, (IN^2D^$BN((B |
Three-dimensional Visualization of Void Fraction Distribution in Steady Two-phase Flow by Thermal Neutron Radiography | N.Takenaka,H.Asano, T.Fujii($B?@8MBg(B) M.Matsubayashi($B868&(B) |
Nuclear Engineering and Design,Vol.184, 203-212,(1998). |
JRR3M,TNRF2 | $B5$1UFsAjN.(B, (I[/D^J]D^Y(B, (IN^2D^$BN(7WB,(B, 3$BCT$B:F9=@.(B |
Neutron Radiography as a Tool for Multiphase Flow Researches in Industrial Machines | N.Takenaka,H.Asano($B?@8MBg(B) T.Nakazawa($B?@8M>&A%Bg(B) H.Umekawa,M.Ozawa($B4X@>Bg(B) |
Proc. the Asia Symposium on Multiphase Flow,275-282 (1999) |
JRR3M,TNRF2 | $B5$1UFsAjN.(B, (IN^2D^$BN((B, $B9)6H@=IJ(B, $BN.F0AX(B, $B6u7dN((B |
Flow Pattern and Void Fraction Distribution of Gas-Liquid Two-Phase Flow in a Plate Heat Exchanger Measured by Neutron Radiography | H.Asano,N.Takenaka,T.Fujii, N.Maeda($B?@8MBg(B) |
Proc. 4th JSME-KSME Thermal Engineering Conference,Vol.1, 591-596(2000) |
JRR3M,TNRF2 | (IL_Z0D$BG.8r494o(B, $B5$1UFsAjN.(B, $BN.F0MM<0(B, (IN^2D^$BN(J,I[(B |
Void Fraction Distribution of Air-Water Two-Phase Flow in a Rod Bundle by Neutron Radiography | N.Takenaka,H.Asano,T.Fujii, S.Hayama,N.Maeda($B?@8MBg(B) |
Proc. 4th JSME-KSME Thermal Engineering Conference,Vol.2, 155-160 (2000) |
JRR3M,TNRF2 | $B5$1UFsAjN.(B, (I[/D^J]D^Y(B, (IN^2D^$BN(7WB,(B, CT$B:F9=@.(B |
Velocity and Void Fraction Measurement in Molten Lead-Bismuth Two-Phase Flow by Neutron Radiography | N.Takenaka,H.Asano,T.Fujii, A.Hashimoto($B?@8MBg(B) |
Proc. 4th JSME-KSME Thermal Engineering Conference,Vol.1, 373-378 (2000) |
JRR3M,TNRF2 | $B1UBN6bB0(B, $B1t(IK^=O=$B5$K"(IN_]L_(B, (IN^2D^$BN((B, PIV$B7WB,(B, (IDZ0;(B |
$B5$1UFsAjN.$N2D;k2=(B,$B7WB,$K$*$1$k%i%8%*%0%i%U%#(B | $BC]Cf?.9,(B($B?@8MBg(B) | $B2D;k2=>pJs(B,Vol.21, No.80,14-19 (2000) |
JRR3M,TNRF2 | $B5$1UFsAjN.(B, (IN^2D^$BN((B, $BN.F0MM<0(B |
Quantitative Measurement of Void Fraction Distribution of Gas-liquid Two-phase Flow in a Spiral Tube by Thermal Neutron Radiography | H.Asano,N.Takenaka,T.Fujii, T.Arakawa($B?@8MBg(B) |
Nondestructive Testing and Evaluation,Vol.16, 363-375 (2001) |
JRR3M,TNRF2 | $B5$1UFsAjN.(B, (I=J_2WY$B4I(B, $BN.F0MM<0(B, (IN^2D^$BN((B |
Flow Characteristics of Gas-Liquid Two-Phase Flow in Plate Heat Exchanger (Visualization and Void Fraction Measurement by Neutron Radiography) | H.Asano,N.Takenaka, T.Fujii,($B?@8MBg(B) |
Experimental Thermal and Fluid Science, (2003)in press. |
JRR3M,TNRF2 | $B5$1UFsAjN.(B, (IL_Z0D$BG.8r494o(B, $BJ(F-FsAjN.(B, (IN^2D^$BN(7WB,(B, $BN.F0MM<0(B, $B6u5$!]?eFsAjN.(B |
Analysis of Lithium Ion distribution in Electolyzed Li1.33Ti1.67O4 by Neutron ComputedTomography | T.Esaka,M.Hayashi,H.Sakaguchi, S.Takai and M.Matsubayashi |
Solid State Ionics, Vol.147,No.1-2, pp.107-114,2002.s |
JRR3M | (I25]$BJ,I[(B, (IXA3Q25]$BEAF3BN(B, $BEE>l7A@.(B |
Analysis of Hydrogen Distribution in HydrogenStorage Alloy Using Neutron Radiography | H.Sakaguchi,Y.Satake, K.Hatakeyama,S.Fujine, K.Yoneda,M.Matsubayasi,T.Esaka |
Journal of Alloys and Compounds,Vol.354, No.1-2,pp.208-215, 2003. |
JRR3M | $B?eAGJ,I[(B, $B?eAG5[B"(B, $B9g6b(B, $B?eAG@H@-(B |
Bubble Behavior and Void Fraction Fluctuation in Vertical Tube Banks Immersed in a Gas-Solid Fluidized Bed Model | M.Ozawa,H.Umekawa,S.Furui and K.Hayashi |
Experimental Thermal and Fluid Science,Vol.26/6-7, 643-652,(2002.8) |
JRR3M,TNRF2 | $BN.F0AX(B, $B?bD>4I72(B, $BN.F0AXG.8r494o(B, $B5$K"5sF0(B |
Flow Visualization of Segregation Process in a Fluidized Bed by Neutron Radiography | S.Furui,H.Umekawa,K.Hayashi M.Ozawa and N.Takenaka |
The 7th World Conference on Neutron Radiography, 2002 |
JRR3M,TNRF2 | $BN.F0AX(B, (I>8^Z9^0<.](B |
Void Fraction Characteristics in a Fluidized Bed with Vertical Tubes | H.Umekawa,S.Furui,K.Hayashi M.Ozawa and N.Takenaka |
The 7th World Conference on Neutron Radiography, 2002 |
JRR3M,TNRF2 | $BN.F0AX(B, $B?bD>4I72(B, $BN.F0AXG.8r494o(B, CT |
$BN.F0AXG.8r494oFb$K?bD>$KG[CV$5$l$?EAG.4I<~$j$N5$K"5sF0(B | $B8E0f=(<#(B,$BG_@n>0;L(B,$BNS9,0l(B, $B>._7 |
$BF|K\5!3#3X2q(B $BO@J8=8(B($B#BJT(B)Vol.68 No.676, 3432-3438,2002 |
JRR3M,TNRF2 | $BN.F0AX(B, $B?bD>4I72(B, $BN.F0AXG.8r494o(B, $B5$K"5sF0(B, (ID^XLDW/8=SC^Y(B |
Application of Neutron Radiography to Designs of Spallation Targets | N.Takenaka,H.Asano,T.Fujii A.Hashimoto($B?@8MBg(B) |
4th InT.Topical Meeting on Neutron Radiography, (2001) |
JRR3M,TNRF2 | $B8GBN(I@09^/D(B, $BHsGK2u8!::(B, $B1UBN6bB0N.$l(B, PIV, (IDZ0;0(B |
Quantitative Measurement of Void Fraction Distribution of Two-Phase Flow in Sub-channels of Rod Bundle | N.Takenaka,H.Asano,T.Fujii, S.Hayama($B?@8MBg(B) |
4th InT.Topical Meeting on Neutron Radiography, (2001) |
JRR3M,TNRF2 | $B5$1UFsAjN.(B, (IN^2D^$BN(7WB,(B, $BDjNL7WB,K!(B, (I[/D^J]D^Y(B, (I;L^A,HY(B |
Image Processing Method to Obtain Symmetrical Distribution from Projection Image | H.Asano,N.Takenaka,T.Fujii, E.Nakamatsu,Y.Tagami($B?@8MBg(B) K.Takeshima ($B9bCN9b@l(B) |
4th InT.Topical Meeting on Neutron Radiography, (2001) |
$B!!(B | $B5$1UFsAjN.(B, (IN^2D^$BN(7WB,(B, (I10M^Y$BJQ49(B, CT$B:F9=@.(B |
Visualization and Void Fraction Measurement of as-Liquid Two-Phase Flow in a Plate Heat Exchanger | H.Asano,N.Takenaka,T.Fujii, N.Maeda,H.Hayashi($B?@8MBg(B) |
4th InT.Topical Meeting on Neutron Radiography, (2001) |
$B!!(B | $B5$1UFsAjN.(B, (IL_Z0D$BG.8r494o(B, (IN^2D^$BN(7WB,(B |
A Method for Quantitative Measurement by Thermal Neutron Radiography | N.Takenaka,H.Asano, T.Fujii($B?@8MBg(B) M.Matsubayashi($B868&(B) |
Nondestructive Testing and Evaluation,Vol.16, 345-354(2001) |
JRR3M,TNRF2 | $B5$1UFsAjN.(B, (IN^2D^$BN(7WB,(B, $BDjNL7WB,K!(B |
Application of Quantitative Measurement Method to Void Fraction of Two-Phase Flow in a Rod Bundle by Neutron Radiography | N.Takenaka,H.Asano,T.Fujii, N.Maeda,S.Hayama($B?@8MBg(B) M.Matsubayashi($B868&(B) |
Nondestructive Testing and Evaluation,Vol.16, 355-362(2001) |
JRR3M,TNRF2 | $B5$1UFsAjN.(B, (I[/D^J]D^Y(B, (IN^2D^$BN(7WB,(B, CT$B:F9=@.(B, $BDjNL7WB,K!(B |
Flow Characteristics of Gas-Liquid Two-Phase Flow in Plate Heat Exchanger (Visualization and Void Fraction Measurement by Neutron Radiography) | H.Asano,N.Takenaka, T.Fujii,($B?@8MBg(B) |
Proc. of the InT. Symposium on Compact Heat Exchangers, 387-392,(2002) |
JRR3M,TNRF2 | $B5$1UFsAjN.(B, (IL_Z0D$BG.8r494o(B, $BJ(F-FsAjN.(B, (IN^2D^$BN(7WB,(B, $BN.F0MM<0(B, $B6u5$(B-$B?eFsAjN.(B |
Visualization and Void Fraction Measurement of Gas-liquid Two-phase Flow in a Commercial Plate Heat Exchanger by Thermal Neutron Radiography | H.Asano,N.Takenaka,T.Fujii, H.Hayashi,T.Wakabayashi($B?@8MBg(B) |
The 7th World ConF.on Neutron Radiography, (2002) |
JRR3M,TNRF2 | $B5$1UFsAjN.(B, (IL_Z0D$BG.8r494o(B, (IN^2D^$BN(7WB,(B, $B6u5$(B-$B?eFsAjN.(B |
Image Processing Methods to Obtain Cross-sectional Void Fraction Distribution of Gas-liquid Two-phase Flow from a Projection Image by Neutron Radiography | H.Asano,N.Takenaka,T.Fujii, E.Nakamatsu,Y.Tagami($B?@8MBg(B) K.Takeshima($B9bCN9b@l(B) |
The 7th World ConF.on Neutron Radiography, (2002) |
JRR3M,TNRF2 | $B5$1UFsAjN.(B, (IN^2D^$BN(7WB,(B, (I10M^Y$BJQ49(B, CT$B:F9=@.(B |
Measurement Uncertainty of Gas-Liquid Two-Phase Flow by Neutron Radiography | N.Takenaka,Y.Tagami, H.Asano($B?@8MBg(B) |
The 7th World ConF.on Neutron Radiography, (2002) |
JRR3M,TNRF2 | $B5$1UFsAjN.(B, (IN^2D^$BN(7WB,(B, $BDjNL7WB,K!(B, $BIT3N$+$52r@O(B |
Towards the Visualization of Fuel Cavitations in a Nozzle of a Diesel Engine by Neutron Radiography | N.Takenaka,T.Kadowaki($B?@8MBg(B) Y.Kawabata($B5~ETBg(B) |
The 7th World ConF.on Neutron Radiography, (2002) |
JRR3M,TNRF2 | $BG3NAJ.L8(II=^Y(B, (I7,K^C0<.](B |
Visualization and Void Fraction Measurement of Gas-Liquid Two-Phase Flow in Heat Exchangers by Neutron Radiography | H.Asano,N.Takenaka, T.Fujii($B?@8MBg(B) K.Takeshima($B9bCN9b@l(B) |
Proc. German-Japanese Workshop on Multiphase Flow, Karlsruhe,Germany, B-17$B!](BB-28,(2002) |
JRR3M,TNRF2 | $B5$1UFsAjN.(B, (IN^2D^$BN(7WB,(B, (IL_Z0D$BG.8r494o(B, (I10M^Y$BJQ49(B |
$B8:05J(F-$rH<$&4IFb5$1UFsAjN.$NN.F0FC@-$K4X$9$k8&5f(B | $B@uLnEy(B($B?@8MBg(B) | $B?@8MBg3XGn;NO@J8(B (2000) | JRR3M,TNRF2 | $B5$1UFsAjN.(B, $B8:05J(F-(B, $B@h:YKv9-(II=^Y(B, (I7,K_WX0A-0L^(B, $BNdG^N.$l(B, (IN^2D^$BN(7WB,(B |
$B%m%C%I%P%s%I%kFb5$1UFsAjN.$N2D;k2=$H7WB,(B | $BC<;3=SJe(B($B?@8MBg(B) | $B?@8MBg3X=$;NO@J8(B (2001) | JRR3M,TNRF2 | $B5$1UFsAjN.(B, (I[/D^J]D^Y(B, (IN^2D^$BN(7WB,(B, CT$B:F9=@.(B |
$B%W%l!<%H<0G.8r494oFb5$1UFsAjN.$NN.F0FC@-$K4X$9$k8&5f(B | $BA0ED7{CK(B($B?@8MBg(B) | $B?@8MBg3X=$;NO@J8(B (2001) | JRR3M,TNRF2 | $B5$1UFsAjN.(B, (IL_Z0D$BG.8r494o(B, (IN^2D^$BN(7WB,(B |
$B9b%(%M%k%.!<2CB.4o1UBN%?!<%2%C%H$K4X$9$k4pAC8&5f(B | $B66K\>O@8(B($B?@8MBg(B) | $B?@8MBg3X=$;NO@J8(B (2001) | JRR3M,TNRF2 | $B1UBN6bB0(B, $B5$K"(IN_]L_(B, (IN^2D^$BN((B, PIV$B7WB,(B, (IDZ0;0(B |
$BJILL$K%o%$%d!<%3%$%k$rM-$9$k?bD>5Z$S?eJ?4IFb$NJ(F-G.EAC#FC@-(B | $BCf>>1Q;V(B($B?@8MBg(B) | $B?@8MBg3X=$;NO@J8(B (2002) | JRR3M,TNRF2 | $B5$1UFsAjN.(B, $BN.F0MM<0(B, (IN^2D^$BN((B, (I\2T0:2Y(B, $BEAG.B%?J4I(B |
$BCf@-;R%i%8%*%0%i%U%#$K$h$k5$1UFsAjN.7WB,$H%b%G%j%s%0(B | $BED>eM[0l(B($B?@8MBg(B) | $B?@8MBg3X=$;NO@J8(B (2003) | JRR3M,TNRF2 | $B5$1UFsAjN.(B, (IN^2D^$BN(7WB,(B, $BDjNL7WB,K!(B, $BIT3N$+$52r@O(B, (I10M^Y$BJQ49(B, CT$B:F9=@.(B |
$B%W%l!<%H<0G.8r494oFb5$1UFsAjN.$NN.F0FC@-$K4X$9$k8&5f(B | $BNS=(E5(B($B?@8MBg(B) | $B?@8MBg3X=$;NO@J8(B (2002) | JRR3M,TNRF2 | $B5$1UFsAjN.(B, (IL_Z0D$BG.8r494o(B, (IN^2D^$BN(7WB,(B, $BB?(IJ_=$BJ,N.(B |
$BO@J8L>(B | $BCx ($BO"Mm@h(B) |
$B7G:\;oL>(B $B4,9f(I%$B%Z!<%8(I%$BH/9TG/(B |
$BMxMQ;\@_(B | $B%-!<%o!<%I(B |
A New Method for Evaluation of Heat Teamster Between Solid Material and Fluid in a porous Medium | $B0l5\9@0l(B($B;3M|Bg3X(B) | Transactions of the ASME Vol.121, pp.978-983 (1999) |
$B!!(B | Thermal Engineering, Porous Medium |
Forced convective heat transfer in square-ripped coolant channels with helium gas for fusion power reactors. | $B9b@%OBG7(B($B868&(B) | Fusion Engineering and Design Voi.49-50, pp.349-354 (2000) |
$B!!(B | Thermal Engineering, square-ripped |
$BHf3SE*69$$6u4VFb$K$*$1$kC10l1_7A>WFMJ.N.$N(B3$B | $B0l5\9@0l(B($B;3M|Bg3X(B) $B;3ED>M@8(B($B;0?.9)6H(B) |
$B2D;k2=>pJs3X2q;o(B Vol.20,No.78 (2000) pp.54-59 |
$B!!(B | Thermal Engineering, Impinging Jet |
Movement of impingement heat transfer by a single circular jet with a confined wall. | $B0l5\9@0l(B($B;3M|Bg3X(B) | International Journal of Heat and Mass Transfer Vol.44,pp.3095-3102 (2001) |
$B!!(B | Thermal Engineering, Impinging Jet |
$BO@J8L>(B | $BCx |
$B7G:\;oL>(B $B4,9f(I%$B%Z!<%8(I%$BH/9TG/(B |
$BMxMQ;\@_(B | $B%-!<%o!<%I(B |
Effects of anion channel blockers on xylem nitrate transport in barley seedlings | Tahei Kawachi,Chizuru Nishijo, Hiroyuki Fujikake, Salwa Abdel-Latif, Norikuni Ohtake,Kuni Sueyoshi, Takuji Ohyama,Noriko Ishioka, Satoshi Watanabe,Akihiko Osa, Toshiaki Sekine, Shinpei Matsuhashi,Taketo Ito, Chizuko Mizuniwa,Tamikazu Kume, Shouji Hashimoto,Hiroshi Uchida, Atsunori Tsuji |
Soil Science and Plant Nutrition, 48$B4,(B,P271-P277, 2002$BG/(B |
TIARA AVF LA1 | (I55Q7^(B, $B>K;@(IDW]=N_@0(B, 13N,PETIS$BF34I(B |
Rapid N transport to pods and seeds in N-deficient soybean plants | Norikuni Ohtake,Takashi Sato, Hiroyuki Fujikake,Kuni Sueyoshi, Takuji Ohyama, Noriko-Shigeta Ishioka, Satoshi Watanabe,Akihiko Osa, Toshiaki Sekine, Shinpei Matsuhashi,Taketo Ito, Chizuko Mizuniwa,Tamikazu Kume, Shouji Hashimoto,Hiroshi Uchida, Atsunori Tsuji |
J. Exp. Bot.,52$B4,(B, P277-P283,2001$BG/(B |
TIARA AVF LA1 | (I@^2=^(B,$Bh2(B, $B;R13N, PETIS, $BCbAG0\9T(B |
Analysis of nitrate absorption and transport in non-nodulated and nodulated soybean plants with 13NO3- and 15NO3- | Takashi Sato,Norikuni Ohtake, Takuji Ohyama, Noriko-S.Ishioka, Satoshi Watanabe,Akihiko Osa, Toshiaki Sekine,Hiroshi Uchida, Atsunori Tsuji, Shinpei Matsuhashi,Taketo Ito, Tamikazu Kume, |
RADIOISOTOPES 48$B4,(B, P450-P458,1999$BG/(B |
TIARA AVF LA | (I@^2=^(B, $B>K;@5[<}(B, $B:,N3(B, 13N,15N, PETIS |
$B?"J*$N@8M}3hF08&5f$N |
$B?9IR(B,$BCf@>M';R(B,$BNS9@><(B, $BBg;3Bn<$(B,$BFbEDGn(B,$B>>66?.J?(B, $B4X:,=SL@(B |
RADIOISOTOPES 50$B4,(B, P408-418,2001$BG/(B |
TIARA AVF LA1 | $B?"J*(B, $B1IM\@8M}(B, PETIS |
QuicK.and reversible inhibition of soybean root nodule growth by nitrate involves a decrease in sucrose$B!!(Bsupply to nodules | H.Fujikake,A.Yamazaki,N.Ohtake, K.Sueyoshi,S.Matsuhashi,T.Ito, C.Mizuniwa,T.Kume,S.Hashimoto, N-S.Ishioka,S.Watanabe,A. Osa, T.Sekine,H.Uchida,A. Tsuji, Takuji Ohyama |
Journal of Experimental Botany,54$B4,(B, p.1379-1388, 2003(4$B7n(B) |
TIARA AVF (I;28[D[](B LA1 |
(I@^2=^(B,$B:,N3(B, $B>K;@AK32(B, $B8w9g@.;:J*(B, 11C,PETIS |
$B?"J*$N@8M}3hF08&5f$N |
$B?9IR(B,$BCf@>M';R(B,$BNS9@><(B, $BBg;3Bn<$(B,$BFbEDGn(B,$B>>66?.J?(B, $B4X:,=SL@(B |
RADIOISOTOPES 50$B4,(B, p.408-418,2001 |
TIARA AVF LA1 | $B?"J*(B, $B1IM\@8M}(B, PETIS |
QuicK.and reversible inhibition of soybean root nodule growth by nitrate involves a decrease in sucrose$B!!(Bsupply to nodules | H.Fujikake,A.Yamazaki,N.Ohtake, K.Sueyoshi,S.Matsuhashi,T.Ito, C.Mizuniwa,T.Kume,S.Hashimoto, N-S.Ishioka,S.Watanabe,A.Osa, T.Sekine,H.Uchida,A.Tsuji, Takuji Ohyama |
Journal of Experimental Botany,54$B4,(B,p.1379-1388, 2003(4$B7n(B) |
TIARA AVF (I;28[D[](B LA1 |
(I@^2=^(B,$B:,N3(B, $B>K;@AK32(B, $B8w9g@.;:J*(B, 11C,PETIS |
Particle size analysis of radioactive aerosols formed by irradiation of argon using$B!!(B65 MeV quasi-monoenergeticneutrons | A.Endo,H.Noguchi,Su.Tanaka, Y.Kanda,Y.Oki,Y.Iida,K.Sato, S.Ysuda |
Applied Radiation and Isotopes 56 (2002) 615-620 |
$B!!(B | $B!!(B |
$BNt2=4D6-2<$K$*$1$k9bEy?"J*$NCbAG(I%$BC:AG0\F0$N2r@O(B | $BBgC]7{K.(B,$BBg;3Bn<$(B,$BKv5HK.(B, $B@nCOB@J<(B,$BF#3]9@9T(B,$BI4@%FF;V(B, $B?{>B>f?M(B,$BD9L@I'(B,$B66K\><;J(B, $B>>66?.J?(B,$B@P2,E5;R(B,$BEOJUCR(B, $B4X:,=SL@(B,$B0KF#3Y?M(B,$B?eDm@iDa;R(B, $BFbEDGn(B,$BDT=_7{(B |
$BBh(B10$B2s(BTIARA$B8&5fH/I=2q(B $BMW;]=8!!(Bp.159-160, 2001 |
TIARA AVF LA1 | $B9bEy?"J*(B, $BCbAG(B,$BC:AG(B, PETIS |
Effect of atmosphere gas condition on soybean(Glycine max. L) 13N2 fixation activity | N.Ohtake,T.Ohyama,K.Sueyoshi, H.Fujikake,N.S.Ishioka, S.Matsuhashi,S.Watanabe, T.Sekine,H.Uchida,A.Tsuji |
TIARA annual report, p.89-91,2001 |
TIARA AVF LA1 | (I@^2=^(B,$B:,N3(B, 13N2,PETIS, $BBg5$>r7o(B |
Analysis of Nitrogen Absorption and Translocation by Soybean Grown in Different Conditions for Phosphorus Supply | N.Ohtake,T.Ohyama,K.Sueyoshi, T.Kawachi,H.Fujikake,A.Momose, T.Suganuma,A.Osa,M.Koizumi, S.Hashimoto,N.Ishioka, S.Watanabe,T.Sekine, S.Matsuhashi,T.Itoh,C.Mizuniwa, H.Uchida,and A.Tsuji |
TIARA annual report, p.93-95,2000 |
TIARA AVF LA1 | (I@^2=^(B, $BCbAG5[<}$H0\9T(B, (IX]$B;@(B |
Effect of NH4+ on 13NO3- absorption and transport in soybean plant | N.Ohtake,T.Ohyama,K.Sueyoshi, T.Kawachi,H.Fujikake,A.Osa, M.Koizumi,S.Hashimoto, N.Ishioka,S.Watanabe, T.Sekine,S.Matsuhashi,T.Ito, C.Mizuniwa,H.Uchida,A.Tsuji |
TIARA annual report, p.67-69,1999 |
TIARA AVF LA1 | (I@^2=^(B,(I1]SF1(B, $B>K;@(B,$B5[<}(B,$B:,(B, 13N,PETIS |
$B |
$BBgC]7{K.(B,$B:4F#9'(B,$BBg;3Bn<$(B, $B@P2,E5;R(B,$BEOJUCR(B,$BD9L@I'(B, $B4X:,=SL@(B,$B>>66?.J?(B,$B0KF#3Y?M(B, $B?eDm@iDa;R(B,$B5WJFL1OB(B,$BFbEDGn(B, $BDT=_7{(B |
$BBh(B8$B2s(BTIARA$B8&5fH/I=2q(B $BMW;]=8(B,p.159-160, 1999 |
TIARA AVF LA1 | (I@^2=^(B,$B 13N,PETIS |
Analysis of nitrate absorption and transportin soybean plant with 13NO3- | T.Sato,N.Ohtake,T.Ohyama, N.Ishioka,S.Watanabe,A.Osa, T.Sekine,S.Matsuhashi,T.Ito, T.Kume,H.Uchida,A.Tsuji |
TIARA annual report 1998 |
TIARA AVF LA1 | (I@^2=^(B,$B 13N,PETIS |
Effect of atmosphere gas condition on soybean(Glycine max. L) 13N2 fixation activity | N.Ohtake,T.Ohyama,K.Sueyoshi, H.Fujikake,N.S.Ishioka, S.Matsuhashi,S.Watanabe, T.Sekine,H.Uchida,A.Tsuji |
TIARA annual report, p.89-91,2001 |
TIARA AVF LA1 | (I@^2=^(B,$B:,N3(B, 13N2,PETIS, $BBg5$>r7o(B |
$BNt2=4D6-2<$K$*$1$k9bEy?"J*$NCbAG(I%$BC:AG0\F0$N2r@O(B | $BBgC]7{K.(B,$BBg;3Bn<$(B,$BKv5HK.(B, $B@nCOB@J<(B,$BF#3]9@9T(B,$BI4@%FF;V(B, $B?{>B>f?M(B,$BD9L@I'(B,$B66K\><;J(B, $B>>66?.J?(B,$B@P2,E5;R(B,$BEOJUCR(B, $B4X:,=SL@(B,$B0KF#3Y?M(B,$B?eDm@iDa;R(B, $BFbEDGn(B,$BDT=_7{(B |
$BBh(B10$B2s(BTIARA$B8&5fH/I=2q(B $BMW;]=8!!(Bp.159-160, 2001 |
TIARA AVF LA1 | $B9bEy?"J*(B, $BCbAG(B,$BC:AG(B, PETIS |
Analysis of Nitrogen Absorption and Translocation by Soybean Grown in Different Conditions for Phosphorus Supply | N.Ohtake,T.Ohyama,K.Sueyoshi, T.Kawachi,H.Fujikake,A.Momose, T.Suganuma,A.Osa,M.Koizumi, S.Hashimoto,N.Ishioka, S.Watanabe,T.Sekine, S.Matsuhashi,T.Itoh,C.Mizuniwa, H.Uchida,A.Tsuji |
TIARA annual report, p.93-95,2000 |
TIARA AVF LA1 | (I@^2=^(B, $BCbAG5[<}$H0\9T(B, $B%j%s;@(B |
Effect of NH4+ on 13NO3- absorption and transport in soybean plant | N.Ohtake,T.Ohyama,K.Sueyoshi, T.Kawachi,H.Fujikake,A.Osa M.Koizumi,S.Hashimoto,N.Ishioka, S.Watanabe,T.Sekine, S.Matsuhashi,T.Ito,C.Mizuniwa, H.Uchida,A.Tsuji |
TIARA annual report, p.67-69,1999 |
TIARA AVF LA1 | (I@^2=^(B,(I1]SF1(B, $B>K;@(B,$B5[<}(B,$B:,(B, 13N,PETIS |
$B |
$BBgC]7{K.(B,$B:4F#9'(B,$BBg;3Bn<$(B, $B@P2,E5;R(B,$BEOJUCR(B,$BD9L@I'(B, $B4X:,=SL@(B,$B>>66?.J?(B,$B0KF#3Y?M(B, $B?eDm@iDa;R(B,$B5WJFL1OB(B,$BFbEDGn(B, $BDT=_7{(B |
$BBh(B8$B2s(BTIARA$B8&5fH/I=2q(B $BMW;]=8(B,p.159-160, 1999 |
TIARA AVF LA1 | (I@^2=^(B,$B 13N,PETIS |
Analysis of nitrate absorption and transport in soybean plant with 13NO3- | T.Sato,N.Ohtake,T.Ohyama, N.Ishioka,S.Watanabe,A.Osa, T.Sekine,S.Matsuhashi,T.Ito, T.Kume,H.Uchida,A.Tsuji |
TIARA annual report 1998$BG/(B |
TIARA AVF LA1 | (I@^2=^(B,$B 13N,PETIS |
$B%]%8%H%m%s3K |
$B?9IR(B($BElBg(B) | $B%7%s%]%8%&%`(B $BCf>.7?HFMQ2CB.4o$N(B $B3X:]E*1~MQ!](B $B%]%8%H%m%s3K $BL>8E20Bg3X(B $B%"%$%=%H!<%W(B $BAm9g%;%s%?!< $B%"%$%=%H!<%W(B $BAm9g%;%s%?!<(B, $B>-Mh9=A[0Q0w2q(B, 2002$BG/(B11$B7n(B26$BF|!%(B |
TIARA LA-1 | $B!!(B |
$B?"J*#P#E#T$N8&5f$+$i(B,$B%Q%M%kF$O@!!86;RNOE}9gK!?M8&5f;\@_$N6&F1MxMQ:#8e$N$"$jJ}$H4|BT!%(B | $B?9IR(B($BElBg(B) | $BBh(B11$B2sEl5~Bg3X(B $B86;RNO8&5fAm9g%;%s%?!<(B $B%7%s%]%8%&%`(B, $BEl5~Bg3X;3>e2q4[(B, 2002$BG/(B10$B7n(B7$B!](B8$BF|!%(B |
TIARA LA-1 | $B!!(B |
$B%H%&%b%m%3%7$NE45[<}JQ0[3t(B'ys1'$B$K$*$1$kE4(B(52Fe)$B$N5[<}(I%$B0\9T(B | $BDMK\c.;V(B,$B@65\@50lO:(B,$BCf@>7$B?9IR(B($BElBg(B) $BEOJUCR(B,$B0KF#3Y?M(B,$B?eDm@iDa;R(B, $B@P2,E5;R(B,$B>>66?.J?(B,$B4X:,=SL@(B($B868&(B) $BFbEDGn(B($BIM%[%H(B) |
$BBh(B11$B2s(BTIARA$B8&5fH/I=2q(B, $B9b:j(B,2002$BG/(B7$B7n!%(B |
TIARA LA-1 | $B!!(B |
Real time 52Fe trasnlocation in barley and maize ys1 mutant visualized by PETIS (positron emitting tracer imaging system) | H.Nakanishi,S.Kiyomiya, T.Tsukamoto($BElBg(B) S.Watanabe,S.Matsuhashi, T.Sekine($B868&(B) N.K.Nishizawa,S.Mori($BElBg(B) |
XI InT.Symposium on Iron Nutrition and Interactions in Plants, Udine(Italy) June,2002 |
TIARA LA-1 | $B!!(B |
$B0!1t7gK3%$%M$G5[<}$5$l$?(B62Zn$B$OMU$G?6F0$9$k(B | $BCf@>7$BDMK\c.;V(B,$BNkLZ4p;K(B($BElBg(B) $BEOJUCR(B,$B>>66?.J?(B,$B@P2,E5;R(B, $B0KF#3Y?M(B,$B?eDm@iDa;R(B, $B4X:,=SL@(B($B868&(B) $B?9IR(B($BElBg(B) |
$BF|K\EZ>mHnNA3X2q(B, $BL>>kBg3X(B($B0&CN(B) 2002$BG/(B4$B7n!%(B |
TIARA LA-1 | $B!!(B |
PETIS$BK!$K$h$k(B,$B%*%*%`%.(I%$B%$%M(I%$B%H%&%b%m%3%7$K$*$1$kE4(B(52Fe)$B$N5[<}(I%$B0\9T$NB,Dj!%(B | $BDMK\?r;V(B,$BCf@>7$B@65\@50lO:(B($BElBg(B) $BFbEDGn(B($BIM%[%H(B) $BEOJUCR(B,$B0KF#3Y?M(B,$B?eDm@iDa;R(B, $B@P2,E5;R(B,$B>>66?.J?(B,$B4X:,=SL@(B($B868&(B) $B?9IR(B($BElBg(B) |
$BF|K\EZ>mHnNA3X2q(B, $BL>>kBg3X(B($B0&CN(B) 2002$BG/(B4$B7n!%(B |
TIARA LA-1 | $B!!(B |
$BO@J8L>(B | $BCx |
$B7G:\;oL>(B $B4,9f(I%$B%Z!<%8(I%$BH/9TG/(B |
$BMxMQ;\@_(B | $B%-!<%o!<%I(B |
Characterization of Fe-Montmormonite : A Stimulant of Buffer Materials Accommodating OverpacK.Corrosion Product | Naohmi Kozai($B868&El3$(B) Yoshifusa Adachi,Sachi Kawamura, Koichi Inada,Tamotsu Kozaki, Seichi Sato,Hiroshi Ohashi($BKLBg(B) Toshihiko Ohuuki and Tsunetaka Banba($B868&El3$(B) |
Journal of Nuclear Science and Technology, 38(12) 1141-1143 (2001) |
$B8&5f(B4$BEo(B | Fe$B7?(IS]SX[E2D(B, $B4K>W:`(B, $B9b(IZM^Y$BJ| |
Observation of Microstructures of Compacted Bentonite by Micro focus X-Ray Computerized Topography(Micro-CT) | Tamotsu Kozaki($BKLBg(B) Satoru Suzuki($B3KG3NA%5%$%/%k5!9=(B) Naofilmi Kozai($B868&El3$(B) Seichi Sato and Hiroshi Ohashi($BKLBg(B) |
Journal of Nuclear Science and Technology, 38(8) 697-699(2001) |
$B8&5f(B4$BEo(B | X$B@~82Hy6@(B, (IM^]DE2D(B, $B4K>W:`(B, $B9b(IZM^Y$BJ| |
Decay Studies of Neutron-deficient Am,Cm,and BK.Nuclei Using an On-line Isotope Separator | M.Asai,M.Sakama,K.Tsukada, S Ichikawa,H.Haba,S.Goto, K.Akiyama,A.Toyoshima,I.Nishinaka, Y.Nagame(Advanced Science Research Center,JAERI) Y.Kojima(Faculty of Engineering,Hiroshima University) Y.Oura,H.Nakahara(Department of Chemistry,Tokyo Metropolitan University) M.Shibata,K.Kawade(Department of Energy Engineering and Science, Nagoya University) |
J.Nucl.Radiochem. Sci.3,187- 190 (2002) |
(I@]C^Q$B2CB.4o(B, (I6^=<^*/D(B-(I5]W2](B $BF10LBNJ,N%4o(B |
(I6^=<^*/D(B-(I5]W2](B $BF10LBNJ,N%4o(B, $BCf@-;RITB-(B, Am,Cm,Bk$B3K $B&A2uJQ(B, $B |
New isotope 233Am | M.Sakama,K.Tsukada,M.Asai, S.Ichikawa,H.Haba,S.Goto, I.Nishinaka,Y.Nagame (Advanced Science Research Center,JAERI) Y.Oura,M.Ebihara,H.Nakahara (Department of Chemistry, Tokyo Metropolitan University) M.Shibata,K.Kawade (Department of Energy Engineering and Science, Nagoya University) Y.Kojima(Faculty of Engineering, Hiroshima University) |
Eur.Phys.J.A9, 303-305(2002) |
(I@]C^Q$B2CB.4o(B, (I6^=<^*/D(B-(I5]W2](B $BF10LBNJ,N%4o(B |
(I1RX<3Q(B, $B?73K $BJ,N%4o(B, $B&A@~(I4HY7^0(B, $BH>8:4|(B, $B |
Status Prospects of Heavy Element Nuclear Chemistry Research at JAERI | Y.Nagame,M.Asai,H.Haba, K.Tsukada,S.Goto,M.Sakama, I.Nishinaka,A.Toyoshima, K.Akiyama,S.Ichikawa (Advanced Science Research Center,JAERI) |
J. Nucl. Radiochem. Sci.3,129-132(2002) |
(I@]C^Q$B2CB.4o(B, (I6^=<^*/D(B-(I5]W2](B $BF10LBNJ,N%4o(B |
(I6^=<^*/D(B-(I5]W2](B $BF10LBNJ,N%4o(B, $B?73K $B3K2=3X(B, $BD6(I%$B=E(I18AI2D^$B3K |
Status Prospects of Heavy Element Nuclear Chemistry Research at JAERI | Y.Nagame,M.Asai,H.Haba, K.Tsukada,S.Goto,M.Sakama, I.Nishinaka,A.Toyoshima, K.Akiyama,S.Ichikawa (Advanced$B!!(BScience Research Center,JAERI) |
J.Nucl.Radiochem. Sci.,3,12132(2002) |
(I@]C^Q$B2CB.4o(B, (I6^=<^*/D(B-(I5]W2](B $BF10LBNJ,N%4o(B |
(I6^=<^*/D(B-(I5]W2](B $BF10LBNJ,N%4o(B, $B?73K $BD6(I%$B=E(I18AI2D^$B3K |
Micro-PIXE$B$rMQ$$$?(BFe$B7?%9%a%/%?%$%H$NFC@-I>2A(B | $B9a@>D>J8(B,$BBg4SIRI'(B($B868&El3$(B) $B?@C+IYM5(B,$B $B:4F#N4Gn(B($B868&9b:j(B) $B>.:j!!40(B,$B:4F#@5CN(B($BKLBg(B) $B0kItGn;V(B($B7'Bg(B) |
$BBh(B18$B2s(BPIXE$B%7%s%]%8%&%`(B | $B8&5f(B4$BEo(B, $B9b:j8&(I%(BMicro-PIXE |
Fe$B7?(IS]SX[E2D(B, $B4K>W:`(B, $B9b(IZM^Y$BJ| |
$BL$CNCf@-;RITB-%"%/%A%N%$%I3K |
$B:e4VL-(B($BFAEgBg0e5;C;(B) $BDMEDOBL@(B,$B@u0f2m?M(B,$B;T@n?J0l(B, $B8eF#??0l(B,$B1)>l9(8w(B,$B@>Cf0lO/(B, $B1JL\M!0lO:(B($B868&@hC<4pAC(I>]@0(B) $B>.Eg9/L@(B($B9-EgBg3X9)3X8&5f2J(B) $BBg1:BY;L(B,$B3$O786=<(B,$BCf8690F;(B ($BEl5~ETN)Bg3XBg3X1!M}3X8&5f2J(B) $B $BBg3X1!%(%M%k%.! |
$BFAEgBg0eC;5*MW(B 10, 129-134(2000) |
(I@]C^Q$B2CB.4o(B, (I6^=<^*/D(B-(I5]W2](B $BF10LBNJ,N%4o(B |
(I6^=<^*/D(B-(I5]W2](B $BF10LBNJ,N%4o(B, $BCf@-;RITB-(B, Am$B3K $B&A2uJQ(B,$B |